Home > Publications database > The End-of-Substructure Card for the ATLAS ITk Strip Detector: Status of the Electronics Design and Results from Recent Quality Control Tests > print

001     485874
005     20250716150834.0
020 _ _ |a 978-1-6654-2113-3
024 7 _ |a 10.1109/NSS/MIC44867.2021.9875706
|2 doi
024 7 _ |a Boebel:2021ubb
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024 7 _ |a inspire:2512575
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|a openalex:W4297808794
037 _ _ |a PUBDB-2022-06902
041 _ _ |a English
100 1 _ |a Boebel, Artur
|0 P:(DE-H253)PIP1088786
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111 2 _ |a 2021 IEEE Nuclear Science Symposium (NSS) and Medical Imaging Conference (MIC) and 28th International Symposium on Room-Temperature Semiconductor Detectors
|g NSS/MIC 2021
|c Yokohama
|d 2021-10-16 - 2021-10-23
|w Japan
245 _ _ |a The End-of-Substructure Card for the ATLAS ITk Strip Detector: Status of the Electronics Design and Results from Recent Quality Control Tests
260 _ _ |a [Piscataway, NJ]
|c 2021
|b IEEE
295 1 0 |a [Ebook] 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) : 28th International Symposium on Room-Temperature Semiconductor Detectors (RTSD) : online conference, 16-23 October 2021, Yokohama, Japa / guest editors : Hideki Tomita, Tatsuya Nakamur; 2021 IEEE NSS MIC , [Piscataway, NJ] : IEEE, 2021,
300 _ _ |a 4
336 7 _ |a CONFERENCE_PAPER
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336 7 _ |a Conference Paper
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336 7 _ |a INPROCEEDINGS
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336 7 _ |a Contribution to a conference proceedings
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336 7 _ |a Contribution to a book
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490 0 _ |a 2512575
|2 Author
500 _ _ |a "This conference was supposed to be held in Yokohama, Japan. The COVID-19 pandemic, however, forced to us change the conference style from conventional face-to-face to virtual." - Vorwort; Literaturangaben;
520 _ _ |a The silicon tracker of the ATLAS experiment will be upgraded for the upcoming High-Luminosity Upgrade of the LHC (HL-LHC). The main building blocks of the new strip tracker are modules that consist of silicon sensors and read-out ASICs, the latter hosted on hybrid PCBs. Up to 14 modules are assembled on carbon-fibre substructures, commonly named staves in the central barrel region and petals in the two end-cap regions, for mechanical support. An End-of-Substructure (EoS) card is located at the end of each substructure and facilitates the transfer of data, power, and control signals between the modules and the off-detector systems. The module front-end ASICs transfer data (up to 28 differential lines at 640 MBit/s) to low-powered GigaBit Transceivers (lpGBT) ASICs on the EoS card. The lpGBT(s) provide data serialisation and use a 10 GBit/s versatile optical link plus transceiver (VTRx+) package to transmit signals to the off-detector systems. To meet the tight integration requirements in the detector, several EoS card designs have been realised. The produced prototypes have been populated with the currently available versions of the lpGBT and VTRx+ ASICs. Here, we present the current status of the EoS cards electronic design, results from extreme temperature, magnetic field and integration tests. Additionally, we discuss the results of detailed investigations into the optical signal quality and introduce a new eye-diagram extraction tool to be used in the Quality Control (QC) procedure that aims to ensure full functionality of the EoS card throughout the entire HL-LHC operation.
536 _ _ |a 622 - Detector Technologies and Systems (POF4-622)
|0 G:(DE-HGF)POF4-622
|c POF4-622
|f POF IV
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588 _ _ |a Dataset connected to CrossRef Conference, INSPIRE
650 _ 7 |a CERN LHC Coll, upgrade
|2 INSPIRE
650 _ 7 |a detector, optical
|2 INSPIRE
650 _ 7 |a electronics, design
|2 INSPIRE
650 _ 7 |a semiconductor detector, microstrip
|2 INSPIRE
650 _ 7 |a electronics, readout
|2 INSPIRE
650 _ 7 |a semiconductor detector, hybrid
|2 INSPIRE
650 _ 7 |a integrated circuit
|2 INSPIRE
650 _ 7 |a quality
|2 INSPIRE
650 _ 7 |a tracking detector
|2 INSPIRE
650 _ 7 |a ATLAS
|2 INSPIRE
650 _ 7 |a silicon
|2 INSPIRE
650 _ 7 |a structure
|2 INSPIRE
650 _ 7 |a buildings
|2 INSPIRE
650 _ 7 |a temperature
|2 INSPIRE
650 _ 7 |a magnetic field
|2 INSPIRE
650 _ 7 |a tracks
|2 INSPIRE
650 _ 7 |a position sensitive
|2 INSPIRE
650 _ 7 |a ultraviolet
|2 INSPIRE
650 _ 7 |a imaging
|2 INSPIRE
650 _ 7 |a nucleus
|2 INSPIRE
650 _ 7 |a radiation detector
|2 INSPIRE
650 _ 7 |a Strips
|2 autogen
650 _ 7 |a Ultraviolet sources
|2 autogen
650 _ 7 |a Prototypes
|2 autogen
650 _ 7 |a Quality control
|2 autogen
650 _ 7 |a Detectors
|2 autogen
650 _ 7 |a Optical detectors
|2 autogen
650 _ 7 |a Optical imaging
|2 autogen
650 _ 7 |a application specific integrated circuits
|2 autogen
650 _ 7 |a nuclear electronics
|2 autogen
650 _ 7 |a optical links
|2 autogen
650 _ 7 |a particle tracks
|2 autogen
650 _ 7 |a position sensitive particle detectors
|2 autogen
650 _ 7 |a quality control
|2 autogen
650 _ 7 |a readout electronics
|2 autogen
650 _ 7 |a silicon radiation detectors
|2 autogen
650 _ 7 |a transceivers
|2 autogen
650 _ 7 |a End-of-Substructure card
|2 autogen
650 _ 7 |a ATLAS ITk strip detector
|2 autogen
650 _ 7 |a electronics design
|2 autogen
650 _ 7 |a silicon tracker
|2 autogen
650 _ 7 |a ATLAS experiment
|2 autogen
650 _ 7 |a upcoming High-Luminosity Upgrade
|2 autogen
650 _ 7 |a main building blocks
|2 autogen
650 _ 7 |a strip tracker
|2 autogen
650 _ 7 |a silicon sensors
|2 autogen
650 _ 7 |a hybrid PCBs
|2 autogen
650 _ 7 |a carbon-fibre substructures
|2 autogen
650 _ 7 |a staves
|2 autogen
650 _ 7 |a central barrel region
|2 autogen
650 _ 7 |a end-cap regions
|2 autogen
650 _ 7 |a control signals
|2 autogen
650 _ 7 |a off-detector systems
|2 autogen
650 _ 7 |a module front-end ASICs
|2 autogen
650 _ 7 |a transfer data
|2 autogen
650 _ 7 |a differential lines
|2 autogen
650 _ 7 |a low-powered GigaBit Transceivers ASICs
|2 autogen
650 _ 7 |a lpGBT
|2 autogen
650 _ 7 |a data serialisation
|2 autogen
650 _ 7 |a versatile optical link
|2 autogen
650 _ 7 |a transceiver package
|2 autogen
650 _ 7 |a EoS card designs
|2 autogen
650 _ 7 |a VTRx+ ASICs
|2 autogen
650 _ 7 |a EoS cards electronic design
|2 autogen
650 _ 7 |a integration tests
|2 autogen
650 _ 7 |a optical signal quality
|2 autogen
650 _ 7 |a Quality Control procedure
|2 autogen
650 _ 7 |a HL-LHC operation
|2 autogen
650 _ 7 |a quality control tests
|2 autogen
693 _ _ |a LHC
|e LHC: ATLAS
|1 EXP:(DE-588)4398783-7
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700 1 _ |a Ceslik, Harald
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700 1 _ |a Dam, Mogens
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700 1 _ |a Diez Cornell, Sergio
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700 1 _ |a Gregor, Ingrid M.
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700 1 _ |a Göttlicher, Peter
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700 1 _ |a Keaveney, James Michael
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700 1 _ |a Naidoo, Joash Nicholas
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700 1 _ |a van der Merwe, Max Nikoi
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700 1 _ |a Oechsle, Jan
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700 1 _ |a Schmitt, Stefan
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700 1 _ |a Stanitzki, Marcel
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700 1 _ |a Ström, Rickard
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700 1 _ |a Wyngaard, Jane
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773 _ _ |a 10.1109/NSS/MIC44867.2021.9875706
856 4 _ |u https://bib-pubdb1.desy.de/record/485874/files/The_End-of-Substructure_Card_for_the_ATLAS_ITk_Strip_Detector_Status_of_the_Electronics_Design_and_Results_from_Recent_Quality_Control_Tests.pdf
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856 4 _ |u https://bib-pubdb1.desy.de/record/485874/files/The_End-of-Substructure_Card_for_the_ATLAS_ITk_Strip_Detector_Status_of_the_Electronics_Design_and_Results_from_Recent_Quality_Control_Tests.pdf?subformat=pdfa
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