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FS-Proposal: I-20220601

IdentifierG:(DE-H253)I-20220601

 

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Role of sample thickness and self-absorption effects in simultaneous XEOL-XAS measurements on single crystalline ZnO and GaN
Physical review research 7(2), 023066 () [10.1103/PhysRevResearch.7.023066]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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 Record created 2022-04-30, last modified 2022-04-30
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