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@ARTICLE{Levcenko:626497,
      author       = {Levcenko, Sergiu and Ritter, Konrad and Falk, Hans and
                      Pfeiffelmann, Timo and Trefflich, Lukas and Welter, Edmund
                      and Grundmann, Marius and Schnohr, Claudia},
      title        = {{R}ole of sample thickness and self-absorption effects in
                      simultaneous {XEOL}-{XAS} measurements on single crystalline
                      {Z}n{O} and {G}a{N}},
      journal      = {Physical review research},
      volume       = {7},
      number       = {2},
      issn         = {2643-1564},
      address      = {College Park, MD},
      publisher    = {APS},
      reportid     = {PUBDB-2025-01450},
      pages        = {023066},
      year         = {2025},
      abstract     = {The x-ray excited optical luminescence (XEOL) for defect
                      and near band edge (NBE) transitions combinedwith
                      simultaneous x-ray absorption measurements are
                      experimentally and theoretically studied on single
                      crystalline ZnO and GaN across the Zn and Ga K edges,
                      respectively, in a wide range of sample
                      thicknesses.Increasing the sample thickness leads to the
                      appearance of an inverted line shape and negative edge jump
                      forthe XEOL defect response, whereas the line shape of the
                      XEOL NBE edge remains positive. A one-dimensionaltransport
                      model is developed, which includes experimental geometry,
                      the creation of x-ray generated excitations,diffusion and
                      recombination of the carriers, and reabsorption of x-ray
                      fluorescence and XEOL photons. Themodel calculations
                      reproduce the experimentally observed changes of the edge
                      shape in the XEOL spectra causedby variation of the sample
                      thickness and reveal surface recombination and optical
                      absorption as the main factorsdetermining the XEOL edge
                      shape for a given sample thickness.},
      cin          = {FS DOOR-User / FS-PET-S},
      ddc          = {530},
      cid          = {$I:(DE-H253)FS_DOOR-User-20241023$ /
                      I:(DE-H253)FS-PET-S-20190712},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3) /
                      FS-Proposal: II-20200005 (II-20200005) / FS-Proposal:
                      I-20220601 (I-20220601) / 05K19OL1 - Identifizierung von
                      Defekten durch elementspezifische Anregung optischer
                      Lumineszenz (BMBF-05K19OL1)},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3 /
                      G:(DE-H253)II-20200005 / G:(DE-H253)I-20220601 /
                      G:(DE-Ds200)BMBF-05K19OL1},
      experiment   = {EXP:(DE-H253)P-P65-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001472569200002},
      doi          = {10.1103/PhysRevResearch.7.023066},
      url          = {https://bib-pubdb1.desy.de/record/626497},
}