Preprint PUBDB-2022-01573

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On the use of multilayer Laue lenses with X-ray Free Electron Lasers

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2022
arXiv

arXiv () [10.48550/ARXIV.2203.11712]  GO

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Report No.: arXiv:2203.11712

Abstract: Multilayer Laue lenses were used for the first time to focus x-rays from an X-ray Free Electron Laser (XFEL). In an experiment, which was performed at the European XFEL, we demonstrated focusing to a spot size of a few tens of nanometers. A series of runs in which the number of pulses per train was increased from 1 to 2, 3, 4, 5, 6, 7, 10, 20 and 30 pulses per train, all with a pulse separation of 3.55 us, was done using the same set of lenses. The increase in the number of pulses per train was accompanied with an increase of x-ray intensity (transmission) from 9% to 92% at 5 pulses per train, and then the transmission was reduced to 23.5 % when the pulses were increased further. The final working condition was 30 pulses per train and 23.5% transmission. Only at this condition we saw that the diffraction efficiency of the MLLs changed over the course of a pulse train, and this variation was reproducible from train to train. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique x-ray source.

Keyword(s): Accelerator Physics (physics.acc-ph) ; Optics (physics.optics) ; FOS: Physical sciences


Contributing Institute(s):
  1. FS-Arbeitsgruppe (FS-ML)
  2. The European X-Ray Laser Project XFEL (XFEL)
  3. The European XFEL Users (XFEL-User)
  4. CFEL-CMI (FS-CFEL-CMI)
  5. beauftragt von UNI (UNI/CUI)
  6. Uni Hamburg / Experimentalphysik (UNI/EXP)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. AIM - CUI: Advanced Imaging of Matter (390715994) (390715994)
Experiment(s):
  1. Experiments at XFEL
  2. MID: Materials Imaging and Dynamics (SASE2)

Appears in the scientific report 2022
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Creative Commons Attribution CC BY 4.0 ; OpenAccess
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Private Collections > >Extern > >HAS-User > >FS-UNI > UNI/CUI
Private Collections > >Extern > >HAS-User > >FS-UNI > UNI/EXP
Private Collections > >DESY > >FS > FS-CFEL-CMI
Private Collections > >DESY > >FS > FS-ML
Private Collections > >XFEL.EU > XFEL-User
Private Collections > >XFEL.EU > XFEL
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 Record created 2022-03-21, last modified 2025-07-24