Integration of machine learning with phase field method to model the electromigration induced Cu$_{6}$Sn$_{5}$ IMC growth at anode side Cu/Sn interface

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Integration of machine learning with phase field method to model the electromigration induced Cu$_{6}$Sn$_{5}$ IMC growth at anode side Cu/Sn interface - PUBDB-2021-00602

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