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@ARTICLE{Gudat:429164,
author = {Gudat, Wolfgang},
title = {{S}oft {X}-ray microscopy and lithography with synchrotron
radiation},
journal = {Nuclear instruments $\&$ methods in physics research},
volume = {152},
number = {1},
issn = {0029-554X},
address = {Amsterdam},
publisher = {Elsevier},
reportid = {PUBDB-2019-04833},
pages = {279 - 288},
year = {1978},
abstract = {Considerable progress in microscopy techniques with soft
X-ray radiation has been achieved in particular through the
application of synchrotron radiation. Various methods which
are currently being studied theoretically or already being
used practically will be described briefly. Attention is
focused on the method of contact microscopy. Various
biological specimens have been investigated by this method
with a resolution as good as 100 Å. X-ray lithography which
in the technical procedure is very similar to contact
microscopy gives promise for the fabrication of high quality
submicron structure in electronic device production.
Important factors limiting the resolution and determining
the performance of contact microscopy and X-ray lithography
will be discussed.},
cin = {L},
ddc = {530},
cid = {I:(DE-H253)L-20120731},
pnm = {899 - ohne Topic (POF3-899)},
pid = {G:(DE-HGF)POF3-899},
experiment = {EXP:(DE-MLZ)NOSPEC-20140101},
typ = {PUB:(DE-HGF)16},
UT = {WOS:A1978FC65200054},
doi = {10.1016/0029-554X(78)90280-X},
url = {https://bib-pubdb1.desy.de/record/429164},
}