%0 Journal Article
%A Tolstikova, A.
%A Levantino, M.
%A Yefanov, O.
%A Hennicke, Vincent
%A Fischer, Pontus
%A Meyer, Jan
%A Mozzanica, A.
%A Redford, S.
%A Crosas, E.
%A Opara, N. L.
%A Barthelmess, Miriam
%A Lieske, J.
%A Oberthür, Dominik
%A Wator, E.
%A Mohacsi, I.
%A Wulff, Michael
%A Schmitt, B.
%A Chapman, H. N.
%A Meents, A.
%T 1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector
%J IUCrJ
%V 6
%N 5
%@ 2052-2525
%C Chester
%M PUBDB-2019-03098
%P 927 - 937
%D 2019
%X Reliable sample delivery and efficient use of limited beam time have remained bottlenecks for serial crystallography (SX). Using a high-intensity polychromatic X-ray beam in combination with a newly developed charge-integrating JUNGFRAU detector, we have applied the method of fixed-target SX to collect data at a rate of 1 kHz at a synchrotron-radiation facility. According to our data analysis for the given experimental conditions, only about 3 000 diffraction patterns are required for a high-quality diffraction dataset. With indexing rates of up to 25
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:31576225
%U <Go to ISI:>//WOS:000484171300017
%R 10.1107/S205225251900914X
%U https://bib-pubdb1.desy.de/record/424856