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Practical surface analysis: Vol. 2: Ion and neutral spectroscopy

 ;

1990
Wiley Chichester
ISBN: 0471920819, 0471964980

Chichester : Wiley : 2nd ed., 738 pages ()  GO

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Keyword(s): neutral spectroscopy ; ion spectroscopy ; sputtering ; surface analysis

Classification:
HH FS 530. 417 Bri 2 1 available Find similar...
Content:
  • Perspective on the analysis of surfaces and interfaces
  • Instrumentation for SIMS
  • Basic aspects of sputter depth profiling
  • Quantitative analysis using sputtering techniques
  • Dynamic SIMS and its applications in microelectronics
  • Static SIMS - surface analysis of inorganic materials
  • Static SIMS - surface analysis of organic materials
  • Sputtered neutral mass spectrometry (SNMS)
  • Ion scattering spectroscopic techniques
  • Medium energy ion scattering
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The record appears in these collections:
Library catalogue > Library holdings > FS (25F/257)
Library catalogue > Library holdings > Hamburg
Linked articles:

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Book  ;
Practical surface analysis: Vol. 1: Auger and X-ray photoelectron spectroscopy
Chichester : Wiley : 2nd edition, 657 pages ()  GO   Download fulltexttable of contents BibTeX | EndNote: XML, Text | RIS

 Record created 2017-08-03, last modified 2020-09-14
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