Contribution to a conference proceedings

PUBDB-2015-06199

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Study of the evolution of artificial defects on the surface of niobium during electrochemical and chemical polishing

Monaco, L. (Corresponding author)>Extern* ; Michelato, P.>Extern* ; Navitski, A.DESY* ; Schaffran, J.DESY* ; Singer, W.DESY* ; Pagani, C.>Extern*DESY* ; Prudnikava, A.>Extern* ; Tamashevich, Y.>Extern*

2015

Abstract: The presence of defects on the inner surface of Nbsuperconducting RF structures might limit its finalperformance. For this reason, strict requirements areimposed during mechanical production of the cavities,specifically on the quality control of the inner surface ofcomponents, to avoid the presence of defects or scratches.Nevertheless, some defects may remain also after controlor can arise from the following production steps.Understanding the evolution of the defect might shinenew insight on its origin and help in defining possiblerepair techniques.This paper reports the topographical evolution ofdefects on a Nb sample polished with the standard recipeused for the 1.3 GHz cavities of the EXFEL project.Various artificial defects of different shape, dimensions,and thicknesses/depths, with geometrical characteristicssimilar to the one that may occur during the machiningand handling of cavities, have been “ad hoc” produced onthe sample of the same material used for the cellfabrication. Analysis shows the evolution of the shape andprofile of the defects at the different polishing steps.

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Contributing Institute(s):

1. Forschung Linear Accelerator (FLA)
2. Supraleitung (MKS3)
3. Planung (MPL)

Research Program(s):

1. 611 - Fundamental Particles and Forces (POF3-611) (POF3-611)
2. 631 - Accelerator R & D (POF3-631) (POF3-631)

Experiment(s):

1. Facility (machine) ILC
2. Facility (machine) XFEL

Appears in the scientific report 2015

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