TY  - JOUR
AU  - Galli, Lorenzo
AU  - Son, Sang-Kil
AU  - Barends, Thomas R. M.
AU  - White, Thomas
AU  - Barty, Anton
AU  - Botha, Sabine
AU  - Boutet, Sébastien
AU  - Caleman, Carl
AU  - Doak, R. Bruce
AU  - Nanao, Max H.
AU  - Nass, Karol
AU  - Shoeman, Robert L.
AU  - Timneanu, Nicusor
AU  - Santra, Robin
AU  - Schlichting, Ilme
AU  - Chapman, Henry N.
TI  - Towards phasing using high X-ray intensity
JO  - IUCrJ
VL  - 2
IS  - 6
SN  - 2052-2525
CY  - Chester
PB  - International Union of Crystallography (IUCr)
M1  - PUBDB-2015-04279
SP  - 1-8
PY  - 2015
AB  - X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein, causing their scattering factors to change during the pulse, with a preferential ‘bleaching’ of heavy atoms. This paper investigates the effects of electronic damage on experimental data collected from a Gd derivative of lysozyme microcrystals at different X-ray intensities, and the degree of ionization of Gd atoms is quantified from phased difference Fourier maps. A pattern sorting scheme isproposed to maximize the ionization contrast and the way in which the local electronic damage can be used for a new experimental phasing method is discussed.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000364415900007
C6  - pmid:26594370
DO  - DOI:10.1107/S2052252515014049
UR  - https://bib-pubdb1.desy.de/record/275862
ER  -