%0 Journal Article
%A Galli, Lorenzo
%A Son, Sang-Kil
%A Barends, Thomas R. M.
%A White, Thomas
%A Barty, Anton
%A Botha, Sabine
%A Boutet, Sébastien
%A Caleman, Carl
%A Doak, R. Bruce
%A Nanao, Max H.
%A Nass, Karol
%A Shoeman, Robert L.
%A Timneanu, Nicusor
%A Santra, Robin
%A Schlichting, Ilme
%A Chapman, Henry N.
%T Towards phasing using high X-ray intensity
%J IUCrJ
%V 2
%N 6
%@ 2052-2525
%C Chester
%I International Union of Crystallography (IUCr)
%M PUBDB-2015-04279
%P 1-8
%D 2015
%X X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein, causing their scattering factors to change during the pulse, with a preferential ‘bleaching’ of heavy atoms. This paper investigates the effects of electronic damage on experimental data collected from a Gd derivative of lysozyme microcrystals at different X-ray intensities, and the degree of ionization of Gd atoms is quantified from phased difference Fourier maps. A pattern sorting scheme isproposed to maximize the ionization contrast and the way in which the local electronic damage can be used for a new experimental phasing method is discussed.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000364415900007
%$ pmid:26594370
%R 10.1107/S2052252515014049
%U https://bib-pubdb1.desy.de/record/275862