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@ARTICLE{Burian:207464,
      author       = {Burian, Tomáš and Hájková, Věra and Chalupský,
                      Jaromír and Vyšín, Luděk and Boháček, Pavel and
                      Přeček, Martin and Wild, Jan and Özkan, Cigdem and
                      Coppola, Nicola and Farahani, Shafagh Dastjani and Schulz,
                      Joachim and Sinn, Harald and Tschentscher, Thomas and
                      Gaudin, Jérôme and Bajt, Saša and Tiedtke, Kai and
                      Toleikis, Sven and Chapman, Henry N. and Loch, Rolf A. and
                      Jurek, Marek and Sobierajski, Ryszard and Krzywinski, Jacek
                      and Moeller, Stefan and Harmand, Marion and Galasso, Germano
                      and Nagasono, Mitsuru and Saskl, Karel and Sovák, Pavol and
                      Juha, Libor},
      title        = {{S}oft {X}-ray {F}ree-{E}lectron {L}aser {I}nduced {D}amage
                      to {I}norganic {S}cintillators},
      journal      = {Optical Materials Express},
      volume       = {5},
      number       = {2},
      issn         = {2159-3930},
      address      = {Washington, DC},
      publisher    = {OSA},
      reportid     = {PUBDB-2015-01362},
      pages        = {254 -264},
      year         = {2015},
      note         = {OA},
      abstract     = {An irreversible response of inorganic scintillators to
                      intense soft x-ray laser radiation was investigated at the
                      FLASH (Free-electron LASer in Hamburg) facility. Three ionic
                      crystals, namely, Ce:YAG (cerium-doped yttrium aluminum
                      garnet), PbWO4 (lead tungstate), and ZnO (zinc oxide), were
                      exposed to single 4.6 nm ultra-short laser pulses of
                      variable pulse energy (up to 12 μJ) under normal incidence
                      conditions with tight focus. Damaged areas produced with
                      various levels of pulse fluences, were analyzed on the
                      surface of irradiated samples using differential
                      interference contrast (DIC) and atomic force microscopy
                      (AFM). The effective beam area of 22.2 ± 2.2 μm2 was
                      determined by means of the ablation imprints method with the
                      use of poly(methyl methacrylate) - PMMA. Applied to the
                      three inorganic materials, this procedure gave almost the
                      same values of an effective area. The single-shot damage
                      threshold fluence was determined for each of these inorganic
                      materials. The Ce:YAG sample seems to be the most radiation
                      resistant under the given irradiation conditions, its damage
                      threshold was determined to be as high as 660.8 ± 71.2
                      mJ/cm2. Contrary to that, the PbWO4 sample exhibited the
                      lowest radiation resistance with a threshold fluence of 62.6
                      ± 11.9 mJ/cm2. The threshold for ZnO was found to be 167.8
                      ± 30.8 mJ/cm2. Both interaction and material
                      characteristics responsible for the damage threshold
                      difference are discussed in the article},
      cin          = {DOOR / FS-FL / FS-ML / FS-CFEL-1 / Eur.XFEL},
      ddc          = {620},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-FL-20120731 /
                      I:(DE-H253)FS-ML-20120731 / I:(DE-H253)FS-CFEL-1-20120731 /
                      $I:(DE-H253)Eur_XFEL-20120731$},
      pnm          = {6211 - Extreme States of Matter: From Cold Ions to Hot
                      Plasmas (POF3-621) / 6G2 - FLASH (POF3-622)},
      pid          = {G:(DE-HGF)POF3-6211 / G:(DE-HGF)POF3-6G2},
      experiment   = {EXP:(DE-H253)F-BL3-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000350664100005},
      doi          = {10.1364/OME.5.000254},
      url          = {https://bib-pubdb1.desy.de/record/207464},
}