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@INPROCEEDINGS{Drube:205915,
      author       = {Drube, Wolfgang},
      title        = {{E}lectronic properties of nano-layer structured materials
                      studied by hard {X}-ray photoelectron spectroscopy},
      reportid     = {PUBDB-2015-00452},
      year         = {2014},
      abstract     = {Electronic properties of complex bulk materials, which
                      often exhibit a modified surface electronic structure,
                      and/or at buried interfaces of multi-nm layered samples are
                      accessible by photoelectron spectroscopy using hard X-ray
                      excitation in the multi keV range (HAXPES), where energetic
                      photoelectrons emerge from deeper inside the material due to
                      their significantly increased inelastic mean free paths.
                      Because photoelectric cross sections rapidly decrease with
                      photon energy above ionization thresholds, the use of
                      brilliant and tunable undulator radiation at 3 rd generation
                      synchrotron sources greatly enhances the effectiveness of
                      this technique which is now emerging at storage ring
                      facilities worldwide.HAXPES is a powerful tool for materials
                      science applications as it allows to study as-grown
                      multi-layered structures without a need for prior in-situ
                      surface treatment or sensitive samples which need to be
                      covered by protective capping layers. Since recently,
                      functional materials such as MIM-structures showing
                      resistive switching behavior are being studied by HAXPES
                      even under "in-operando" conditions. An overview will be
                      given on the current state of the technique highlighting its
                      great potential by recent scientific results.},
      month         = {Feb},
      date          = {2014-02-24},
      organization  = {The 3rd International Conference on
                       Physics at Surfaces and Interfaces,
                       Puri (India), 24 Feb 2014 - 28 Feb
                       2014},
      subtyp        = {Invited},
      cin          = {FS-PEX},
      cid          = {I:(DE-H253)FS-PEX-20130206},
      pnm          = {PETRA Beamline P09 (POF2-54G14)},
      pid          = {G:(DE-H253)POF2-P09-20130405},
      experiment   = {EXP:(DE-H253)P-P09-20150101},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://bib-pubdb1.desy.de/record/205915},
}