Search for $B_{s}^{0}\rightarrow\gamma\gamma$ and a measurement of the branching fraction for $B_{s}^{0}\rightarrow\phi\gamma$

Dutta, D.; Staric, M.; Kim, Donghwan; Liventsev, D.; Wang, Changhai; Pestotnik, R.; Won, E.; Matvienko, D.; Kim, M. J.; Choi, Y.; Mori, T.; He, X. H.; Said, S. Al; Kang, K. H.; Cheon, B. G.; Jaegle, I.; Sumiyoshi, T.; Hou, W. S.; Kim, K. T.; Bobrov, A.; Cho, K.; Bakich, A. M.; Wang, P.; Frost, O.; Golob, B.; Arinstein, K.; Iijima, T.; Ishikawa, A.; Browder, T. E.; Libby, J.; Watanabe, Y.; Sumihama, M.; Santelj, L.; Vanhoefer, P.; Zhilich, V.; Hayashii, H.; Piilonen, L. E.; Sakai, Y.; Korpar, S.; Petric, M.; Ko, B. R.; Ogawa, S.; Asner, D. M.; Aushev, T.; Rostomyan, A.; Kim, Sunhyung; Goh, Y. M.; Bonvicini, G.; Mizuk, R.; Solovieva, E.; Ritter, M.; Varner, G.; Wagner, M. N.; Krizan, P.; Schneider, O.; Bracko, M.; Farhat, H.; Aulchenko, V.; Moll, A.; Kinoshita, K.; Uno, S.; Williams, K. M.; Adachi, I.; Aziz, T.; Li, Y.; Yamaoka, J.; Bhardwaj, V.; Sohn, Y. S.; Dutta, K.; Miyata, H.; Lewis, P.; Unno, Y.; Kim, J. H.; Mohanty, Gaurav; Ganguly, S.; Chistov, R.; Getzkow, D.; Yashchenko, S.; Wehle, S.; Nayak, M.; Eidelman, S.; Kodys, P.; Abdesselam, A.; Mussa, R.; Ayad, R.; Nakao, M.; Schwanda, C.; Aihara, H.; Yamamoto, H.; Sanuki, T.; Vinokurova, A.; Lange, J. S.; Chen, A.; Okuno, S.; Kim, Y. J.; Shibata, T. A.; Chobanova, V.; Pedlar, T. K.; Nisar, N. K.; Dalseno, J.; Drutskoy, A.; Krokovny, P.; Kim, J. B.; Chilikin, K.; Pakhlov, P.; Sato, Y.; Cervenkov, D.; Simon, F.; Bansal, V.; Semmler, D.; Drasal, Z.; Shebalin, V.; Zhang, Z. P.; Teramoto, Y.; Gaur, V.; Vossen, A.; Van Hulse, C.; Sibidanov, A.; Kuhr, T.; Bhuyan, B.; Bahinipati, S.; Yusa, Y.; Dolezal, Z.; Shiu, J. G.; Iwasaki, Y.; Schnell, G.; Sokolov, A.; Schwartz, A. J.; Trabelsi, K.; Ribezl, E.; Savinov, V.; Kuzmin, A.; Zupanc, A.; Kiesling, C.; Fast, J. E.; Kato, E.; Joffe, D.; Cinabro, D.; Nakano, E.; Pakhlova, G.; Belle Collaboration; Nishida, S.; Sandilya, S.; Shwartz, B.; Nanut, T.; Lee, I. S.; Garmash, A.; Kwon, Y. J.; Li Gioi, L.; Usov, Y.; Uchida, M.

Search for $B_{s}^{0}\rightarrow\gamma\gamma$ and a measurement of the branching fraction for $B_{s}^{0}\rightarrow\phi\gamma$

Dutta, D. (Corresponding Author) ; Bhuyan, B. ; Abdesselam, A. ; Adachi, I. ; Aihara, H. ; Said, S. A. ; Arinstein, K. ; Asner, D. M. ; Aulchenko, V. ; Aushev, T. ; Ayad, R. ; Aziz, T. ; Bahinipati, S. ; Bakich, A. M. ; Bansal, V. ; Bhardwaj, V. ; Bobrov, A.Extern* ; Bonvicini, G. ; Bracko, M. ; Browder, T. E. ; Cervenkov, D. ; Chen, A. ; Cheon, B. G. ; Chilikin, K. ; Chistov, R. ; Cho, K. ; Chobanova, V. ; Choi, Y. ; Cinabro, D. ; Dalseno, J. ; Dolezal, Z. ; Drasal, Z. ; Drutskoy, A.Extern* ; Dutta, K.DESY* ; Eidelman, S. ; Farhat, H. ; Fast, J. E. ; Frost, O.DESY* ; Gaur, V. ; Ganguly, S. ; Garmash, A. ; Getzkow, D. ; Goh, Y. M. ; Golob, B. ; Hayashii, H. ; He, X. H. ; Hou, W. S. ; Iijima, T. ; Ishikawa, A. ; Iwasaki, Y. ; Jaegle, I. ; Joffe, D. ; Kang, K. H. ; Kato, E. ; Kiesling, C.Extern* ; Kim, D.Extern* ; Kim, J. B. ; Kim, J. H.Extern* ; Kim, K. T. ; Kim, M. J. ; Kim, S.Extern* ; Kim, Y. J. ; Kinoshita, K. ; Ko, B. R. ; Kodys, P.Extern* ; Korpar, S. ; Krizan, P. ; Krokovny, P. ; Kuhr, T.Extern* ; Kuzmin, A.Extern* ; Kwon, Y. J. ; Lange, J. S.Extern* ; Lee, I. S. ; Lewis, P. ; Li, Y.Extern* ; Li Gioi, L.Extern* ; Libby, J. ; Liventsev, D. ; Matvienko, D. ; Miyata, H. ; Mizuk, R.DESY* ; Mohanty, G.Extern* ; Moll, A. ; Mori, T. ; Mussa, R. ; Nakano, E. ; Nakao, M.Extern* ; Nanut, T. ; Nayak, M.Extern* ; Nisar, N. K. ; Nishida, S. ; Ogawa, S. ; Okuno, S. ; Pakhlov, P. ; Pakhlova, G. ; Pedlar, T. K. ; Pestotnik, R. ; Petric, M. ; Piilonen, L. E. ; Ribezl, E. ; Ritter, M.DESY*XFEL* ; Rostomyan, A.DESY* ; Sakai, Y. ; Sandilya, S. ; Santelj, L. ; Sanuki, T. ; Sato, Y. ; Savinov, V. ; Schneider, O. ; Schnell, G.Extern* ; Schwanda, C. ; Schwartz, A. J. ; Semmler, D. ; Shebalin, V. ; Shibata, T. A. ; Shiu, J. G. ; Shwartz, B. ; Sibidanov, A. ; Simon, F.DESY* ; Sohn, Y. S. ; Sokolov, A. ; Solovieva, E. ; Staric, M. ; Sumihama, M. ; Sumiyoshi, T. ; Teramoto, Y. ; Trabelsi, K. ; Uchida, M. ; Unno, Y. ; Uno, S. ; Usov, Y. ; Van Hulse, C. ; Vanhoefer, P. ; Varner, G. ; Vinokurova, A. ; Vossen, A. ; Wagner, M. N. ; Wang, C.Extern* ; Wang, P. ; Watanabe, Y. ; Wehle, S.DESY* ; Williams, K. M. ; Won, E. ; Yamamoto, H. ; Yamaoka, J. ; Yashchenko, S.DESY* ; Yusa, Y. ; Zhang, Z. P. ; Zhilich, V. ; Zupanc, A. ; Belle Collaboration (Collaboration author)

2014

This record in other databases:

Report No.: BELLE-PREPRINT-2014-18; KEK-PREPRINT-2014-32; arXiv:1411.7771

Abstract: We search for the decay ${B}_{s}^{0}\to \gamma \gamma $ and measure the branching fraction for ${B}_{s}^{0}\to \varphi \gamma $ using $121.4\text{}\text{}{\mathrm{fb}}^{-1}$ of data collected at the $\mathrm{\Upsilon }\left(5S\right)$ resonance with the Belle detector at the KEKB asymmetric-energy ${e}^{+}{e}^{-}$ collider. The ${B}_{s}^{0}\to \varphi \gamma $ branching fraction is measured to be $\left(3.6±0.5\left(\text{stat}\right)±0.3\left(\text{syst}\right)±0.6\left({f}_{s}\right)\right)×1{0}^{-5}$, where ${f}_{s}$ is the fraction of ${B}_{s}^{\left(*\right)}{\overline{B}}_{s}^{\left(*\right)}$ in $b\overline{b}$ events. Our result is in good agreement with the theoretical predictions as well as with a recent measurement from LHCb. We observe no statistically significant signal for the decay ${B}_{s}^{0}\to \gamma \gamma $ and set a 90% confidence-level upper limit on its branching fraction at $3.1×1{0}^{-6}$. This constitutes a significant improvement over the previous result.

Keyword(s): electron positron: annihilation ; electron positron: colliding beams ; Upsilon(10870): electroproduction ; Upsilon(10870): hadronic decay ; B/s0: radiative decay ; B/s0: branching ratio: measured ; B/s0: branching ratio: upper limit ; experimental results ; BELLE ; KEK-B ; B/s0 --> 2photon ; B/s0 --> Phi(1020) photon

Note: OA

Contributing Institute(s):

beauftragt von FH1 (Belle)

Research Program(s):

Experiments at KEK (BELLE I/II) (POF2-515) (POF2-515)

Experiment(s):

KEK: BELLE I/II

Appears in the scientific report 2014

Database coverage:
Published

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