TY  - JOUR
AU  - Albrecht, Manfred
AU  - Brombacher, Christoph
TI  - Rapid thermal annealing of FePt thin films
JO  - Physica status solidi / A
VL  - 210
IS  - 7
SN  - 1862-6300
CY  - Weinheim
PB  - Wiley-VCH
M1  - DESY-2014-02099
SP  - 1272 - 1281
PY  - 2013
N1  - © WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim; Post referee fulltext in progress; Embargo 12 months from publication
AB  - In this study, Fe52Pt48 thin films were DC magnetron sputter-deposited at room temperature onto thermally oxidized silicon wafers. Rapid thermal annealing (RTA) was employed to induce the phase transformation from the chemically disordered A1 phase into the chemically ordered L10 phase. The influence of the annealing temperature, annealing time, and the film thickness on the ordering transformation and (001) texture evolution of FePt films was studied. Rapid thermal annealed films processed at temperatures larger than 600 °C exhibit high chemical L10 order with strong (001) texture. The resultant high perpendicular magnetic anisotropy and large coercivities up to 40 kOe are demonstrated. Simultaneously to the ordering transformation, RTA leads to a strong dewetting behavior of the film forming large islands.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000327699800004
DO  - DOI:10.1002/pssa.201228718
UR  - https://bib-pubdb1.desy.de/record/167768
ER  -