Home > Publications database > In-situ X-ray diffraction for investigating the high temperature activation of a protective oxide layer on $\gamma$-TiAl
 
Talk (non-conference) PHPPUBDB-12325
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In-situ X-ray diffraction for investigating the high temperature activation of a protective oxide layer on $\gamma$-TiAl

 ;  ;  ; DESY

2010

HASYLAB Usermeeting 2010, HamburgHamburg, Germany, 27 Jan 2010 - 29 Jan 20102010-01-272010-01-29  GO

Contributing Institute(s):
  1. Experiments with synchrotron radiation (HASYLAB)
Research Program(s):
  1. DORIS Beamline G3 (POF2-54G13) (POF2-54G13)
  2. FS-Proposal: I-20090014 (I-20090014) (I-20090014)
Experiment(s):
  1. DORIS Beamline G3 (DORIS III)

Appears in the scientific report 2010
Database coverage:
No Author Disambiguation
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Private Collections > >DESY > >FS > HASYLAB(-2012)
Document types > Presentations > Talks (non-conference)
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 Record created 2012-09-19, last modified 2016-10-19
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