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000087505 1001_ $$0P:(DE-H253)PIP1005123$$aKrikunova, M.$$b0$$eCorresponding author$$udesy
000087505 1101_ $$aDESY$$bExperiments with synchrotron radiation
000087505 245__ $$aTime-Resolved Ion Spectrometry on Xenon with Jitter-Compensated Soft X-Ray Pulses of a Free-Electron Laser
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000087505 300__ $$a123019
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000087505 520__ $$aAtomic inner-shell relaxation dynamics were measured at the free-electron laser in Hamburg, FLASH, delivering 92 eV pulses. The decay of 4d core holes created in xenon was followed by detection of ion charge states after illumination with delayed 400 nm laser pulses. A timing jitter of the order of several hundred femtoseconds between laser- and accelerator-pulses was compensated for by a simultaneous delay measurement in a single-shot x-ray/laser cross-correlator. After sorting of the tagged spectra according to the measured delays, a temporal resolution equivalent to the pulse duration of the optical laser could be established. While results on ion charge states up to Xe4+ are compatible with a previous study using a high-harmonic soft x-ray source, a new relaxation pathway is opened by the nonlinear excitation of xenon atoms in the intense free-electron laser light field, leading to the formation of Xe$^{5+}$.
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000087505 7001_ $$0P:(DE-H253)PIP1006756$$aMaltezopoulos, Th.$$b1
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000087505 773__ $$0PERI:(DE-600)1464444-7$$a10.1088/1367-2630/11/12/123019$$gVol. 11, no. 12, p. 123019 -$$n12$$p123019$$tNew journal of physics$$v11$$x1367-2630$$y2009
000087505 85640 $$uhttp://www.iop.org/EJ/abstract/1367-2630/11/12/123019
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