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@INBOOK{Kavetskyy:87268,
      author       = {Kavetskyy, T. and Shpotyuk, O. and Kaban, I. and Hoyer, W.
                      and Filipecki, J. and Reithmaier, J.P. and Petkov, P. and
                      Kulisch, W. and Popov, C. and DESY},
      title        = {{N}anostructural characterization of amorphous
                      chalcogenides by {X}-ray diffraction and positron
                      annihilation techniques},
      journal      = {Nanostructured Materials for Advanced Technological
                      Applications},
      address      = {Dordrecht},
      publisher    = {Springer Netherlands},
      reportid     = {PHPPUBDB-9622},
      isbn         = {978-1-4020-9915-1},
      pages        = {365-370},
      year         = {2009},
      comment      = {Nanostructured Materials for Advanced Technological
                      Applications},
      booktitle     = {Nanostructured Materials for Advanced
                       Technological Applications},
      cin          = {HASYLAB},
      cid          = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
      pnm          = {DORIS Beamline BW5 (POF1-550)},
      pid          = {G:(DE-H253)POF1-BW5-20130405},
      experiment   = {EXP:(DE-H253)D-BW5-20150101},
      typ          = {PUB:(DE-HGF)7},
      UT           = {WOS:000264872500041},
      doi          = {10.1007/978-1-4020-9916-8_41},
      url          = {https://bib-pubdb1.desy.de/record/87268},
}