TY  - CHAP
AU  - Kavetskyy, T.
AU  - Shpotyuk, O.
AU  - Kaban, I.
AU  - Hoyer, W.
AU  - Filipecki, J.
AU  - Reithmaier, J.P.
AU  - Petkov, P.
AU  - Kulisch, W.
AU  - Popov, C.
AU  - DESY
TI  - Nanostructural characterization of  amorphous chalcogenides by X-ray diffraction and positron annihilation techniques
JO  - Nanostructured Materials for Advanced Technological Applications
CY  - Dordrecht
PB  - Springer Netherlands
M1  - PHPPUBDB-9622
SN  - 978-1-4020-9915-1
SP  - 365-370
PY  - 2009
LB  - PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:000264872500041
DO  - DOI:10.1007/978-1-4020-9916-8_41
UR  - https://bib-pubdb1.desy.de/record/87268
ER  -