%0 Book Section
%A Kavetskyy, T.
%A Shpotyuk, O.
%A Kaban, I.
%A Hoyer, W.
%A Filipecki, J.
%A Reithmaier, J.P.
%A Petkov, P.
%A Kulisch, W.
%A Popov, C.
%A DESY
%T Nanostructural characterization of  amorphous chalcogenides by X-ray diffraction and positron annihilation techniques
%J Nanostructured Materials for Advanced Technological Applications
%C Dordrecht
%I Springer Netherlands
%M PHPPUBDB-9622
%@ 978-1-4020-9915-1
%P 365-370
%D 2009
%< Nanostructured Materials for Advanced Technological Applications
%F PUB:(DE-HGF)7
%9 Contribution to a book
%U <Go to ISI:>//WOS:000264872500041
%R 10.1007/978-1-4020-9916-8_41
%U https://bib-pubdb1.desy.de/record/87268