| Home > Authorities > Periodicals > Journal of research of the National Institute of Standards and Technology |
| Type: | journal |
| DDC: | 600 |
| Keywords(s): | Technik, Zeitschrift, Online-Ressource, Naturwissenschaften, Zeitschrift, Online-Ressource, Messtechnik, Zeitschrift, Online-Ressource, General Engineering |
| ISSN(s): | 0034-530X, 0096-6231, 0096-8579, 0160-1741, 1044-677X, 2165-7254, 2376-5259, 2376-8991 |
| Publisher: | US Gov. Print. Off. : Washington, DC 1988- |
| Country: | United States of America |
| Appears: | online, print |
| ID: | PERI:(DE-600)1473724-3 |
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Journal Article
Synchrotron radiation excited fluorescence micro-analysis using a new imaging technique
Journal of research of the National Institute of Standards and Technology 93(3), 379 - (1988) [10.6028/jres.093.085]
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