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Quality concerns caused by quality control — deformation of silicon strip detector modules in thermal cycling tests
Salami, R. (Corresponding author) ; Poley, L. ; Affolder, K. ; Affolder, T. ; Bayer, L. ; Crick, B. ; Duden, E. ; Dyckes, I. G. ; Fadeyev, V. ; Fortman, A. ; Federič, P. ; Franconi, L. ; Gignac, M. ; Gupta, S. ; Hallford, J. ; Helling, C. ; Hill, E. ; Hu, M. ; Kroll, J. ; Kumari, P. ; Lacasta, C. ; Levagood, M. ; Lopez, H. ; Morelos-Zaragoza, L. ; Moshe, M. R. ; Petersen, A. ; Platero, V. ; Rajagopalan, A. D. ; Sitnikova, L. ; Solaz, C. ; Soldevila, U. ; Speers, P. ; Nieuwenhuizen, G. V. ; Wang, A. Z.
2025
Inst. of Physics
London
This record in other databases:
Please use a persistent id in citations: doi:10.1088/1748-0221/20/03/P03004
Contributing Institute(s):
- LHC/ATLAS Experiment (ATLAS)
Research Program(s):
- 611 - Fundamental Particles and Forces (POF4-611) (POF4-611)
Experiment(s):
- LHC: ATLAS
Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection