%0 Journal Article
%A De Vincentis, Natalia S.
%A Muñoz, Jairo A.
%A Benatti, Emanuel
%A Sandim, Hugo R. Z.
%A Avalos, Martina C.
%A Brokmeier, H.-G.
%A Bolmaro, Raúl E.
%T A study combining EBSD and x-ray synchrotron diffraction using generalized pole figures
%J Materials characterization
%V 229
%@ 1044-5803
%C New York, NY
%I Science Direct
%M PUBDB-2025-04607
%P 115641
%D 2025
%X The development of advanced materials with optimum structural and mechanical properties requires a detailed control of their microstructures, textures and crystalline defects. Different techniques can be used for the characterization of those microstructures and defects, but it is their combination that could result in an exhaustive understanding of the microstructural and orientational developments on these materials.X-Ray Diffraction (XRD) can be employed to obtain a “global” characterization of microstructure and texture, since the presence of defects in the sample produces shift and broadening of diffraction peaks. Different models have been developed to quantify these defects, some of which require fitting the complete diffraction pattern while others just individual peaks. These techniques can be extended to texture measurements, often represented through pole figures (PFs), wherein diffraction patterns are obtained for different sample orientations. This allows the determination of defect density in function of orientations and their representation in Generalized Pole Figures (GPFs).On the other hand, for a more “local” characterization, Electron Backscatter Diffraction (EBSD) has proven to be extremely useful for microstructural and orientational analysis, allowing to assess defect accumulation in individual grains and orientations.In this work, a set of 32,205 duplex steel samples cold-rolled up to 79 
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1016/j.matchar.2025.115641
%U https://bib-pubdb1.desy.de/record/639650