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@ARTICLE{Sapnik:639303,
author = {Sapnik, Adam F. and Chater, Philip A. and Keeble, Dean S.
and Evans, John S. O. and Bertolotti, Federica and
Guagliardi, Antonietta and Støckler, Lise J. and Harbourne,
Elodie A. and Borup, Anders B. and Silberg, Rebecca S. and
Descamps, Adrien and Prescher, Clemens and Klee, Benjamin D.
and Phelipeau, Axel and Ullah, Imran and Medina, Kárel G.
and Bird, Tobias A. and Kaznelson, Viktoria and Lynn,
William and Goodwin, Andrew L. and Iversen, Bo B. and
Crepisson, Celine and Bozin, Emil S. and Jensen, Kirsten M.
Ø. and McBride, Emma E. and Neder, Reinhard B. and
Robinson, Ian and Wark, Justin S. and Andrzejewski, Michał
and Boesenberg, Ulrike and Brambrink, Erik and Camarda,
Carolina and Cerantola, Valerio and Goede, Sebastian and
Höppner, Hauke and Humphries, Oliver S. and Konopkova,
Zuzana and Kujala, Naresh and Michelat, Thomas and
Nakatsutsumi, Motoaki and Pelka, Alexander and Preston,
Thomas R. and Randolph, Lisa and Roeper, Michael and
Schmidt, Andreas and Strohm, Cornelius and Tang, Minxue and
Talkovski, Peter and Zastrau, Ulf and Appel, Karen and Keen,
David A.},
title = {{H}igh-quality ultra-fast total scattering and pair
distribution function data using an {X}-ray free-electron
laser},
journal = {IUCrJ},
volume = {12},
number = {5},
issn = {2052-2525},
address = {Chester},
reportid = {PUBDB-2025-04404},
pages = {531 - 547},
year = {2025},
abstract = {High-quality total scattering data, a key tool for
understanding atomic-scale structure in disordered
materials, require stable instrumentation and access to high
momentum transfers. This is now routine at dedicated
synchrotron instrumentation using high-energy X-ray beams,
but it is very challenging to measure a total scattering
dataset in less than a few microseconds. This limits their
effectiveness for capturing structural changes that occur at
the much faster timescales of atomic motion. Current X-ray
free-electron lasers (XFELs) provide femtosecond-pulsed
X-ray beams with maximum energies of ∼24 keV, giving the
potential to measure total scattering and the attendant pair
distribution functions (PDFs) on femtosecond timescales. We
demonstrate that this potential has been realized using the
HED scientific instrument at the European XFEL and present
normalized total scattering data for 0.35 Å−1 < Q <
16.6 Å−1 and their PDFs from a broad spectrum of
materials, including crystalline, nanocrystalline and
amorphous solids, liquids and clusters in solution. We
analyzed the data using a variety of methods, including
Rietveld refinement, small-box PDF refinement, joint
reciprocal–real-space refinement, cluster refinement and
Debye scattering analysis. The resolution function of the
setup is also characterized. We conclusively show that
high-quality data can be obtained from a single ∼30 fs
XFEL pulse for multiple different sample types. Our efforts
not only significantly increase the existing maximum
reported Q range for an S(Q) measured at an XFEL but also
mean that XFELs are now a viable X-ray source for the broad
community of people using reciprocal-space total scattering
and PDF methods in their research.},
cin = {DOOR ; HAS-User / FS-HIBEF / $XFEL_E1_HED$ /
$XFEL_DO_ID_LAS$},
ddc = {530},
cid = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-HIBEF-20240110
/ $I:(DE-H253)XFEL_E1_HED-20210408$ /
$I:(DE-H253)XFEL_DO_ID_LAS-20210408$},
pnm = {623 - Data Management and Analysis (POF4-623) / 6G3 - PETRA
III (DESY) (POF4-6G3) / DFG project G:(GEPRIS)521549147 -
Eigenschaften eisenhaltiger Geomaterialien unter Bedingungen
der Kern-Mantel Grenze (521549147) / DFG project
G:(GEPRIS)500707704 - SPP 2404: Rekonstruktion der Dynamik
des tiefen Erdinnern über geologische Zeiträume (DeepDyn)
(500707704)},
pid = {G:(DE-HGF)POF4-623 / G:(DE-HGF)POF4-6G3 /
G:(GEPRIS)521549147 / G:(GEPRIS)500707704},
experiment = {EXP:(DE-H253)P-P02.1-20150101},
typ = {PUB:(DE-HGF)16},
doi = {10.1107/S205225252500538X},
url = {https://bib-pubdb1.desy.de/record/639303},
}