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000637202 1001_ $$0P:(DE-H253)PIP1008819$$aLehmkühler, Felix$$b0$$eCorresponding author$$udesy
000637202 245__ $$aMonitoring nanoparticle self-assembly on liquid subphases in situ in a vertical scattering geometry
000637202 260__ $$a[Amsterdam]$$bElsevier$$c2025
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000637202 520__ $$aNanoparticle (NP) self-assembly is a promising tool for the straightforward preparation of complex materials without lithography. Self-assembly on liquid subphases is established for the preparation of thin NP films with quasicrystalline order on large scales. Small-angle X-ray scattering (SAXS) at synchrotron radiation sources is in particular advantageous to study self-assembly in situ, providing detailed structural information with high temporal resolution. Here we present a new experimental setup that allows measuring SAXS in a vertical geometry. This way it is possible to study the self-assembly of nanoparticles on liquid subphases in situ as demonstrated with gold nanoparticles. In contrast to measurements with grazing incidence (GISAXS), spatial resolution in the µm range and sampling of the volume material is possible. Integration of optical microscopy allows observing the measurement position and formation of supercrystal flakes. The setup can be used to study self-assembly of various nanoparticles on liquid subphases but is not limited to such studies. It was realized at the beamline P10 at PETRA III (Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany). 
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000637202 536__ $$0G:(GEPRIS)390715994$$aAIM, DFG project G:(GEPRIS)390715994 - EXC 2056: CUI: Advanced Imaging of Matter (390715994)$$c390715994$$x2
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000637202 693__ $$0EXP:(DE-H253)P-P10-20150101$$1EXP:(DE-H253)PETRAIII-20150101$$6EXP:(DE-H253)P-P10-20150101$$aPETRA III$$fPETRA Beamline P10$$x0
000637202 7001_ $$0P:(DE-H253)PIP1006002$$aWestermeier, Fabian$$b1
000637202 7001_ $$00009-0001-6579-904X$$aBarrios-Capuchino, Juan J.$$b2
000637202 7001_ $$0P:(DE-H253)PIP1016762$$aWeschke, Daniel$$b3
000637202 7001_ $$0P:(DE-H253)PIP1027104$$aDallari, Francesco$$b4
000637202 7001_ $$0P:(DE-H253)PIP1004234$$aRoseker, Wojciech$$b5
000637202 7001_ $$0P:(DE-H253)PIP1085825$$aParak, Wolfgang J.$$b6
000637202 7001_ $$0P:(DE-H253)PIP1019230$$aSchulz, Florian$$b7$$eCorresponding author
000637202 770__ $$aIn-situ X-ray Characterization and Nanoscale Imaging Techniques at Synchrotrons and XFELs 
000637202 773__ $$0PERI:(DE-600)3188188-9$$a10.1016/j.nwnano.2025.100132$$gVol. 11, p. 100132 -$$p100132 $$tNano trends$$v11$$x2666-9781$$y2025
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000637202 9141_ $$y2025
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