000637145 001__ 637145
000637145 005__ 20250904212717.0
000637145 0247_ $$2doi$$a10.1186/s11671-025-04332-5
000637145 0247_ $$2ISSN$$a1556-276X
000637145 0247_ $$2ISSN$$a1931-7573
000637145 0247_ $$2ISSN$$a2731-9229
000637145 0247_ $$2datacite_doi$$a10.3204/PUBDB-2025-03778
000637145 037__ $$aPUBDB-2025-03778
000637145 041__ $$aEnglish
000637145 082__ $$a620
000637145 1001_ $$0P:(DE-H253)PIP1009828$$aGrigorian, Souren$$b0$$eCorresponding author
000637145 245__ $$aIn-operando characterizations of oligothiophene OFETs: controlling the structure-property relationships at the nanoscale
000637145 260__ $$a[New York]$$bSpringer US$$c2025
000637145 3367_ $$2DRIVER$$aarticle
000637145 3367_ $$2DataCite$$aOutput Types/Journal article
000637145 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1756990477_2044258
000637145 3367_ $$2BibTeX$$aARTICLE
000637145 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000637145 3367_ $$00$$2EndNote$$aJournal Article
000637145 500__ $$aRussische Institute beteiligt! 
000637145 520__ $$aGrazing Incident Wide Angle X-ray Scattering (GIWAXS) studies on organic field-effect transistors (OFETs) fabricated with an aliphatic functionalized α,α'-quinquethiophene (i.e. 5,5′′′′-dihexyl-2,2′:5′,2′′:5′′,2′′′:5′′′,2′′′′-quinquethiophene, DH5T) thin film, were carried out. The structure-property relationships of the semiconductor material were investigated. A detailed, spatially resolved microstructural characterization of the active layer was carried out with the aim of understanding the role of the film’s microstructure on electrical performance. For this purpose, a custom-made setup designed for in-operando tests of OFETs was used, allowing a correlation under measured conditions of the complex microstructure with the thin film electrical behavior, under operating conditions. The GIWAXS measurements revealed a significant anisotropy of the DH5T thin films, under source-drain applied voltages (V$_{sd}$). Particularly notable variations were observed for both in-plane and out-of-plane directions. Upon applying the Vsd, the microstructure remained relatively stable in the out-of-plane (001) direction, suggesting that this orientation is less affected by the applied voltages. However, in the in-plane (020) direction, an increase of the $π–π$ stacking of the DH5T molecules was found, indicating a stronger response of the microstructure to the applied voltage. Notably, a higher tensile strain, exceeding 1%, was observed at a V$_{sd}$ of − 10 V, suggesting that the application of voltage induces significant structural reorganization in the thin film, which may have implications for optimizing the performance of OFETs in practical applications.     
000637145 536__ $$0G:(DE-HGF)POF4-6G3$$a6G3 - PETRA III (DESY) (POF4-6G3)$$cPOF4-6G3$$fPOF IV$$x0
000637145 588__ $$aDataset connected to CrossRef, Journals: bib-pubdb1.desy.de
000637145 693__ $$0EXP:(DE-H253)P-P03-20150101$$1EXP:(DE-H253)PETRAIII-20150101$$6EXP:(DE-H253)P-P03-20150101$$aPETRA III$$fPETRA Beamline P03$$x0
000637145 7001_ $$0P:(DE-H253)PIP1011657$$aDavydok, Anton$$b1
000637145 7001_ $$0P:(DE-H253)PIP1011879$$aGrodd, Linda$$b2
000637145 7001_ $$0P:(DE-HGF)0$$aLuponosov, Yuriy$$b3
000637145 7001_ $$0P:(DE-HGF)0$$aPonomarenko, Sergey$$b4
000637145 7001_ $$0P:(DE-H253)PIP1109748$$aFratoddi, Ilaria$$b5
000637145 773__ $$0PERI:(DE-600)2253244-4$$a10.1186/s11671-025-04332-5$$gVol. 20, no. 1, p. 138$$n1$$p138$$tDiscover nano$$v20$$x1556-276X$$y2025
000637145 8564_ $$uhttps://bib-pubdb1.desy.de/record/637145/files/s11671-025-04332-5.pdf$$yOpenAccess
000637145 8564_ $$uhttps://bib-pubdb1.desy.de/record/637145/files/s11671-025-04332-5.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000637145 909CO $$ooai:bib-pubdb1.desy.de:637145$$popenaire$$popen_access$$pVDB$$pdriver$$pdnbdelivery
000637145 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1009828$$aExternal Institute$$b0$$kExtern
000637145 9101_ $$0I:(DE-588b)16087541-9$$6P:(DE-H253)PIP1011657$$aHelmholtz-Zentrum Geesthacht$$b1$$kHZG
000637145 9101_ $$0I:(DE-588b)1231250402$$6P:(DE-H253)PIP1011657$$aHelmholtz-Zentrum Hereon$$b1$$kHereon
000637145 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1011879$$aExternal Institute$$b2$$kExtern
000637145 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1109748$$aExternal Institute$$b5$$kExtern
000637145 9131_ $$0G:(DE-HGF)POF4-6G3$$1G:(DE-HGF)POF4-6G0$$2G:(DE-HGF)POF4-600$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lGroßgeräte: Materie$$vPETRA III (DESY)$$x0
000637145 9141_ $$y2025
000637145 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2023-08-31
000637145 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000637145 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0501$$2StatID$$aDBCoverage$$bDOAJ Seal$$d2023-07-11T11:17:09Z
000637145 915__ $$0StatID:(DE-HGF)0500$$2StatID$$aDBCoverage$$bDOAJ$$d2023-07-11T11:17:09Z
000637145 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0700$$2StatID$$aFees$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000637145 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bDOAJ : Anonymous peer review$$d2023-07-11T11:17:09Z
000637145 915__ $$0StatID:(DE-HGF)0561$$2StatID$$aArticle Processing Charges$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0320$$2StatID$$aDBCoverage$$bPubMed Central$$d2023-08-31
000637145 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2023-08-31
000637145 9201_ $$0I:(DE-H253)HAS-User-20120731$$kDOOR ; HAS-User$$lDOOR-User$$x0
000637145 9201_ $$0I:(DE-H253)Hereon-20210428$$kHereon$$lHelmholtz-Zentrum Hereon$$x1
000637145 980__ $$ajournal
000637145 980__ $$aVDB
000637145 980__ $$aUNRESTRICTED
000637145 980__ $$aI:(DE-H253)HAS-User-20120731
000637145 980__ $$aI:(DE-H253)Hereon-20210428
000637145 9801_ $$aFullTexts