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100 1 _ |a Kerfoot, James
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245 _ _ |a Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes
260 _ _ |a Cambridge
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500 _ _ |a JK, GAR and MWG acknowledge funding from the Engineeringand Physical Science Research Council (EPSRC) (Project: EP/V053884/1) and support from the Nanoscale and MicroscaleResearch Centre (nmRC). EJL and AJP would like to acknowl-edge the National Measurement System (NMS) of theDepartment for Science, Innovation and Technology (DSIT),UK ( projects #128826) for funding. The authors thankDongkuk Kim and Sebastian Wood at the National PhysicalLaboratory, U.K., for discussion associated with themanuscript.
520 _ _ |a Benchmarking the near-field signal enhancement attained using plasmonic metal-coated atomic force microscopy (AFM) probes for tip-enhanced Raman spectroscopy (TERS) and tip-enhanced photoluminescence (TEPL) measurements is challenging given the absence of a suitable reference sample that is simple to prepare, easy to use and compatible with different instrument configurations. To this end, in this study, we have fabricated a flake of monolayer tungsten diselenide (1L-WSe$_2$) stamped across the interface of gold and silver thin films on silicon dioxide and glass. We have demonstrated these samples to be effective for the facile determination of near-field Raman and photoluminescence contrast factors in both gap and non-gap mode, respectively. We show that the near-degenerate E$^1$$_{2g}$ + A$_{1g}$ and 2LA(M) peaks in the Raman spectra of WSe$_2$2 enable quantification of Raman contrast factors, with a ∼1.6-fold increase in TERS signal enhancement in gap mode, relative to non-gap mode, observed for a typical probe. Similar differences in the photoluminescence contrast factors were observed comparing in-contact and out-of-contact signal intensity ratios from gap and non-gap mode TEPL measurements. Moreover, in developing a reference methodology we found that the line shape of the TEPL profile was dependent upon the magnitude of the signal enhancement, with a disproportionate increase in the longer wavelength shoulder of the emission observed in gap mode. As this contribution to the asymmetric line shape is tentatively assigned to a dark exciton, which possesses an out-of-plane transition dipole moment, our TEPL measurements indicate that the directionality of the near-field enhancement provides a further handle enabling quantification of probe performance. Using samples prepared on glass, and comparing results obtained from two different instruments, each with a different excitation laser wavelength and optical access, we demonstrate the universal applicability of our reference material for sensitivity benchmarking of metallised AFM probes in both gap and non-gap mode, suitable for both reflection and transmission geometries, and across the range of laser wavelengths typically used for TERS and TEPL.
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700 1 _ |a Legge, Elizabeth J.
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700 1 _ |a Collins, Amy
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700 1 _ |a Chauhan, Jasbinder
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700 1 _ |a Rossnagel, Kai
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700 1 _ |a Beton, Peter H.
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700 1 _ |a Mellor, Christopher J.
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700 1 _ |a Pollard, Andrew J.
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700 1 _ |a Rance, Graham A.
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700 1 _ |a George, Michael W.
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773 _ _ |a 10.1039/D5AN00456J
|g Vol. 150, no. 14, p. 3077 - 3088
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