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@ARTICLE{Kraus:633155,
      author       = {Kraus, Irene and Wu, Mingjian and Rechberger, Stefanie and
                      Will, Johannes and Maiti, Santanu and Kuhlmann, Andreas and
                      Huck, Marten and Lüer, Larry and Bertram, Florian and
                      Steinrueck, Hans-Georg and Unruh, Tobias and Brabec,
                      Christoph J. and Spiecker, Erdmann},
      title        = {3{D} {E}lectron {D}iffraction as {GIWAXS} {A}lternative for
                      {Q}uantitative {S}tructural {C}haracterization of {O}rganic
                      {S}olar {C}ells},
      reportid     = {PUBDB-2025-02351, arXiv:2502.11254},
      year         = {2025},
      note         = {23AcknowledgementsThe authors gratefully acknowledge
                      funding by the German Research Foundation (DFG) through
                      theCollaborative Research Center SFB 953 “Synthetic carbon
                      allotropes” and the Research Training GroupGRK 1896 “In
                      situ microscopy with electrons, x-rays and scanning
                      probes.”},
      abstract     = {We demonstrate elastically filtered 3D Electron Diffraction
                      (3D ED) as a powerful alternative technique to Grazing
                      Incidence Wide-Angle X-ray Scattering (GIWAXS) for
                      quantitatively characterizing the structure of organic
                      semiconductor films. Using a model material system of
                      solvent vapor annealed DRCN5T:PC71BM thin film, which is
                      employed in organic solar cells (OSCs), we extract the
                      structural data obtained from 3D ED and compare with that
                      from GIWAXS, utilizing both laboratory and synchrotron X-ray
                      sources. Quantitative evaluation of the datasets in terms of
                      peak positions, peak widths and mosaicity revealed good
                      agreement between both techniques, qualifying 3D ED as an
                      alternative tool for analyzing highly beam-sensitive organic
                      thin films. Furthermore, the respective advantages and
                      limitations of 3D ED and GIWAXS are discussed, emphasizing
                      the unique capability of 3D ED to integrate seamlessly with
                      the diverse imaging and spectroscopic modalities in modern
                      TEM. This integration enriches the techniques of structural
                      characterization of OSCs, paving the way for deeper insights
                      into their structural properties and ultimately their
                      performance.},
      keywords     = {Materials Science (cond-mat.mtrl-sci) (Other) / FOS:
                      Physical sciences (Other)},
      cin          = {DOOR ; HAS-User / FS-PET-D},
      cid          = {I:(DE-H253)HAS-User-20120731 /
                      I:(DE-H253)FS-PET-D-20190712},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3) /
                      FS-Proposal: R-20240703 (R-20240703) / DFG project
                      G:(GEPRIS)182849149 - SFB 953: Synthetische
                      Kohlenstoffallotrope (182849149) / GRK 1896 - GRK 1896:
                      In-situ-Mikroskopie mit Elektronen, Röntgenstrahlen und
                      Rastersonden (218975129)},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3 /
                      G:(DE-H253)R-20240703 / G:(GEPRIS)182849149 /
                      G:(GEPRIS)218975129},
      experiment   = {EXP:(DE-H253)P-P08-20150101},
      typ          = {PUB:(DE-HGF)25},
      eprint       = {2502.11254},
      howpublished = {arXiv:2502.11254},
      archivePrefix = {arXiv},
      SLACcitation = {$\%\%CITATION$ = $arXiv:2502.11254;\%\%$},
      doi          = {10.3204/PUBDB-2025-02351},
      url          = {https://bib-pubdb1.desy.de/record/633155},
}