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000633155 0247_ $$2datacite_doi$$a10.3204/PUBDB-2025-02351
000633155 0247_ $$2arXiv$$aarXiv:2502.11254
000633155 037__ $$aPUBDB-2025-02351
000633155 088__ $$2arXiv$$aarXiv:2502.11254
000633155 1001_ $$0P:(DE-H253)PIP1112280$$aKraus, Irene$$b0
000633155 245__ $$a3D Electron Diffraction as GIWAXS Alternative for Quantitative Structural Characterization of Organic Solar Cells
000633155 260__ $$c2025
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000633155 500__ $$a23AcknowledgementsThe authors gratefully acknowledge funding by the German Research Foundation (DFG) through theCollaborative Research Center SFB 953 “Synthetic carbon allotropes” and the Research Training GroupGRK 1896 “In situ microscopy with electrons, x-rays and scanning probes.”
000633155 520__ $$aWe demonstrate elastically filtered 3D Electron Diffraction (3D ED) as a powerful alternative technique to Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) for quantitatively characterizing the structure of organic semiconductor films. Using a model material system of solvent vapor annealed DRCN5T:PC71BM thin film, which is employed in organic solar cells (OSCs), we extract the structural data obtained from 3D ED and compare with that from GIWAXS, utilizing both laboratory and synchrotron X-ray sources. Quantitative evaluation of the datasets in terms of peak positions, peak widths and mosaicity revealed good agreement between both techniques, qualifying 3D ED as an alternative tool for analyzing highly beam-sensitive organic thin films. Furthermore, the respective advantages and limitations of 3D ED and GIWAXS are discussed, emphasizing the unique capability of 3D ED to integrate seamlessly with the diverse imaging and spectroscopic modalities in modern TEM. This integration enriches the techniques of structural characterization of OSCs, paving the way for deeper insights into their structural properties and ultimately their performance.
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000633155 650_7 $$2Other$$aMaterials Science (cond-mat.mtrl-sci)
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000633155 7001_ $$aWu, Mingjian$$b1
000633155 7001_ $$aRechberger, Stefanie$$b2
000633155 7001_ $$0P:(DE-H253)PIP1031148$$aWill, Johannes$$b3
000633155 7001_ $$0P:(DE-H253)PIP1013106$$aMaiti, Santanu$$b4
000633155 7001_ $$0P:(DE-H253)PIP1018541$$aKuhlmann, Andreas$$b5
000633155 7001_ $$aHuck, Marten$$b6
000633155 7001_ $$aLüer, Larry$$b7
000633155 7001_ $$0P:(DE-H253)PIP1007852$$aBertram, Florian$$b8$$udesy
000633155 7001_ $$0P:(DE-H253)PIP1014424$$aSteinrueck, Hans-Georg$$b9
000633155 7001_ $$0P:(DE-H253)PIP1011282$$aUnruh, Tobias$$b10
000633155 7001_ $$0P:(DE-H253)PIP1081799$$aBrabec, Christoph J.$$b11
000633155 7001_ $$0P:(DE-H253)PIP1111615$$aSpiecker, Erdmann$$b12$$eCorresponding author
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