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@INPROCEEDINGS{Fevola:632953,
      author       = {Fevola, Giovanni and Ossig, Christina Sonja and Verezhak,
                      Mariana and Garrevoet, Jan and Seyrich, Martin and
                      Brueckner, Dennis and Hagemann, Johannes and Seiboth, Frank
                      and Schropp, Andreas and Falkenberg, Gerald and Jorgensen,
                      Peter Stanley and Strelow, Christian and Kipp, Tobias and
                      Carron, Romain and Andreasen, Jens Wenzel and Stuckelberger,
                      Michael E.},
      title        = {{T}hree-{D}imensional and {M}ultimodal {X}-{R}ay
                      {M}icroscopy {R}eveals the {I}mpact of {V}oids in {CIGS}
                      {S}olar {C}ells},
      reportid     = {PUBDB-2025-02281},
      year         = {2023},
      abstract     = {The formation of small voids in polycrystalline absorbers
                      has been repeatedly reported, whether after device
                      fabrication ordegradation. Although it certainly increases
                      risk of delamination and complicates deposition of
                      additional top layers and cells, itis not clear whether or
                      how detrimental it is for photovoltaic performance. In our
                      study, using synchrotron imaging, wenon-destructively probe
                      local performance deficits attributable to voids and
                      highlight the complex 3D nature of structuraldefects in
                      high-efficiency thin-film CIGS solar cells. We find that,
                      although possibly detrimental at a local level, voids only
                      have aminor effect at the device level, given the abundance
                      of voids and the high efficiency of the cell. Our
                      quantification of theabsolute electron densities at the
                      nanoscale may enable the development of adequate
                      comprehensive models simulatingstructural and electronic
                      defects. In the full presentation, we will show
                      high-resolution images and 3D renderings ofnanostructures in
                      CIGS and put them in the context of spatially resolved
                      performance measurements. Furthermore, we willshowcase
                      recent developments in X-ray imaging and give an outlook to
                      technical developments at new X-ray sources that willbecome
                      available in the coming years and enable a further increase
                      of sensitivity and spatial resolution.},
      month         = {Jun},
      date          = {2023-06-11},
      organization  = {2023 IEEE 50th Photovoltaic
                       Specialists Conference, San Juan (USA),
                       11 Jun 2023 - 16 Jun 2023},
      cin          = {FS-PETRA / FS-PETRA-BO / FS-PET-S},
      cid          = {I:(DE-H253)FS-PETRA-20140814 /
                      I:(DE-H253)FS-PETRA-BO-20240110 /
                      I:(DE-H253)FS-PET-S-20190712},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3)},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3},
      experiment   = {EXP:(DE-H253)P-P06-20150101},
      typ          = {PUB:(DE-HGF)1},
      doi          = {10.1109/PVSC48320.2023.10359840},
      url          = {https://bib-pubdb1.desy.de/record/632953},
}