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@INPROCEEDINGS{Davis:626193,
author = {Davis, Naomi and Arling, Jan-Hendrik and Baselga, Marta and
Diehl, Leena and Dingfelder, Jochen and Gregor, Ingrid-Maria
and Hauser, Marc and Hügging, Fabian and Jakobs, Karl and
Karagounis, Michael and Koppenhöfer, Roland and Kröninger,
Kevin and Lex, Fabian and Parzefall, Ulrich and Sari, Birkan
and Sorgenfrei, Niels and Spannagel, Simon and Sperlich,
Dennis and Velyka, Anastasiia and Weingarten, Jens and Wei,
Yingjie and Zatocilova, Iveta},
title = {{S}imulation of {CMOS} strip sensors},
journal = {Nuclear instruments $\&$ methods in physics research /
Section A},
volume = {1080},
issn = {0167-5087},
address = {[Amsterdam]},
publisher = {Elsevier},
reportid = {PUBDB-2025-01333},
pages = {170807},
year = {2025},
abstract = {In high-energy physics, there is a need to investigate
silicon sensor concepts that offer large-area coverage and
cost-efficiency for particle tracking detectors. Sensors
based on CMOS imaging technology present a promising
alternative silicon sensor concept. As this technology
follows an industry process, it can lower sensor production
costs and enable fast and large-scale production from
various vendors. The CMOS strips project investigates
passive CMOS strip sensors fabricated by LFoundry in a 150nm
technology. The stitching technique was employed to develop
two different strip sensor formats. The strip implant layout
varies in doping concentration and width, allowing the study
of various depletion concepts and electric field
configurations. The performance of the first CMOS strip
sensor prototype was evaluated based on several test beam
campaigns conducted at the DESY II Test Beam Facility. In
order to understand and validate the test beam data results,
the detector response was simulated. This study shows how
performance differences of the various strip sensor layouts
can be investigated using Monte Carlo methods combined with
TCAD Device simulations. In particular, the detector
response simulated with Allpix2 is presented and compared to
test beam data.},
month = {Feb},
date = {2025-02-17},
organization = {Proceedings of the Vienna Conference
on Instrumentation, Vienna (Austria),
17 Feb 2025 - 21 Feb 2025},
keywords = {CMOS (autogen) / Silicon strip sensors (autogen) / Test
beam (autogen) / TCAD (autogen) / Allpix (autogen) / Monte
Carlo simulation (autogen)},
cin = {ATLAS},
ddc = {530},
cid = {I:(DE-H253)ATLAS-20120731},
pnm = {622 - Detector Technologies and Systems (POF4-622)},
pid = {G:(DE-HGF)POF4-622},
experiment = {EXP:(DE-H253)TestBeamline22-20150101},
typ = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8},
doi = {10.1016/j.nima.2025.170807},
url = {https://bib-pubdb1.desy.de/record/626193},
}