TY  - CONF
AU  - Davis, Naomi
AU  - Arling, Jan-Hendrik
AU  - Baselga, Marta
AU  - Diehl, Leena
AU  - Dingfelder, Jochen
AU  - Gregor, Ingrid-Maria
AU  - Hauser, Marc
AU  - Hügging, Fabian
AU  - Jakobs, Karl
AU  - Karagounis, Michael
AU  - Koppenhöfer, Roland
AU  - Kröninger, Kevin
AU  - Lex, Fabian
AU  - Parzefall, Ulrich
AU  - Sari, Birkan
AU  - Sorgenfrei, Niels
AU  - Spannagel, Simon
AU  - Sperlich, Dennis
AU  - Velyka, Anastasiia
AU  - Weingarten, Jens
AU  - Wei, Yingjie
AU  - Zatocilova, Iveta
TI  - Simulation of CMOS strip sensors
JO  - Nuclear instruments & methods in physics research / Section A
VL  - 1080
SN  - 0167-5087
CY  - [Amsterdam]
PB  - Elsevier
M1  - PUBDB-2025-01333
SP  - 170807
PY  - 2025
AB  - In high-energy physics, there is a need to investigate silicon sensor concepts that offer large-area coverage and cost-efficiency for particle tracking detectors. Sensors based on CMOS imaging technology present a promising alternative silicon sensor concept. As this technology follows an industry process, it can lower sensor production costs and enable fast and large-scale production from various vendors. The CMOS strips project investigates passive CMOS strip sensors fabricated by LFoundry in a 150nm technology. The stitching technique was employed to develop two different strip sensor formats. The strip implant layout varies in doping concentration and width, allowing the study of various depletion concepts and electric field configurations. The performance of the first CMOS strip sensor prototype was evaluated based on several test beam campaigns conducted at the DESY II Test Beam Facility. In order to understand and validate the test beam data results, the detector response was simulated. This study shows how performance differences of the various strip sensor layouts can be investigated using Monte Carlo methods combined with TCAD Device simulations. In particular, the detector response simulated with Allpix2 is presented and compared to test beam data.
T2  - Proceedings of the Vienna Conference on Instrumentation
CY  - 17 Feb 2025 - 21 Feb 2025, Vienna (Austria)
Y2  - 17 Feb 2025 - 21 Feb 2025
M2  - Vienna, Austria
KW  - CMOS (autogen)
KW  - Silicon strip sensors (autogen)
KW  - Test beam (autogen)
KW  - TCAD (autogen)
KW  - Allpix (autogen)
KW  - Monte Carlo simulation (autogen)
LB  - PUB:(DE-HGF)16 ; PUB:(DE-HGF)8
DO  - DOI:10.1016/j.nima.2025.170807
UR  - https://bib-pubdb1.desy.de/record/626193
ER  -