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@ARTICLE{Huang:626024,
      author       = {Huang, X. and Uemura, Y. and Ardana-Lamas, F. and
                      Frankenberger, P. and Knoll, M. and Yousef, H. and Wang, H.
                      and Heder, S. and Nachtegaal, M. and Smolentsev, G. and
                      Wang, L. and Zhu, L. F. and Milne, C. and Lima, F. A.},
      title        = {{A} high-energy {L}aue {X}-ray emission spectrometer at the
                      {FXE} instrument at the {E}uropean {XFEL}},
      journal      = {Journal of synchrotron radiation},
      volume       = {32},
      number       = {3},
      issn         = {0909-0495},
      address      = {Chester},
      publisher    = {IUCr},
      reportid     = {PUBDB-2025-01261},
      pages        = {506 - 523},
      year         = {2025},
      abstract     = {The high-energy-resolution X-ray emission spectroscopy
                      (XES) spectrometersavailable at the Femtosecond X-ray
                      Experiment (FXE) instrument of theEuropean XFEL operate in
                      Bragg (reflective) geometry, with optimumperformance in the
                      range between 5 and 15 keV. However, they quickly
                      loseefficiency above around 15 keV due to the decrease in
                      reflectivity of the crystalanalyzers at such high photon
                      energies. This hampers high-energy-resolutionspectroscopy
                      experiments on heavy elements (e.g. 4d metals), which thus
                      do notfully profit from the high-photon-energy capabilities
                      of the European XFEL.Here we present the design,
                      implementation and performance of a novel high-resolution
                      XES spectrometer operating in Laue (transmission) geometry
                      opti-mized for measurements at high photon energies (> 15
                      keV). The High-EnergyLaue X-ray emIssiOn Spectrometer
                      (HELIOS) operates mainly in dispersivemode by placing the
                      crystal analyzer inside or outside the Rowland circle.
                      TheLaue spectrometer performance in terms of energy
                      resolution and efficiency ispresented and discussed. Two
                      Laue analyzers, silicon and quartz, have beentested at
                      SuperXAS of the Swiss Light Source and at FXE of the
                      EuropeanXFEL. The quartz analyzer was found to be about 2.7
                      times more efficient thanthe silicon one. The Laue
                      spectrometer energy resolution (�E/E) reached at theFXE
                      instrument is around 1.2 � 10 4. Depending on different
                      user requests, theresolution can be further increased by
                      using higher diffraction orders. The newLaue spectrometer
                      increases the existing portfolio of XES spectrometers atFXE,
                      enabling efficient implementation of ultrafast X-ray
                      spectroscopies withhigh energy resolution at photon energies
                      above 15 keV. This spectrometer willallow the expansion of
                      studies in the field of ultrafast sciences,
                      particularlyincluding investigation of 4d elements using
                      hard X-rays.},
      cin          = {$XFEL_E1_FXE$},
      ddc          = {550},
      cid          = {$I:(DE-H253)XFEL_E1_FXE-20210408$},
      pnm          = {6G13 - Accelerator of European XFEL (POF4-6G13)},
      pid          = {G:(DE-HGF)POF4-6G13},
      experiment   = {EXP:(DE-H253)XFEL-Exp-20150101},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:40163362},
      UT           = {WOS:001486450700001},
      doi          = {10.1107/S1600577525001389},
      url          = {https://bib-pubdb1.desy.de/record/626024},
}