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@ARTICLE{Janknecht:624365,
author = {Janknecht, Rebecca and Hahn, Rainer and Koutná, Nikola and
Todt, Juraj and Meindlhumer, Michael and Davydok, Anton and
Riedl, Helmut and Keckes, Jozef and Mayrhofer, Paul H.},
title = {{C}ombined {X}-ray microdiffraction and micromechanical
testing for direct measurement of thin film elastic
constants},
journal = {Materials and design},
volume = {252},
issn = {0264-1275},
address = {Amsterdam [u.a.]},
publisher = {Elsevier Science},
reportid = {PUBDB-2025-00834},
pages = {113720},
year = {2025},
abstract = {Direct measurement of elastic constants for thin films is
still far from routine and poses significant technical and
analytical challenges compared to bulk materials. Ab initio
Density Functional Theory calculations offer theoretical
input, however, discrepancies between model systems and
real-world properties persist, primarily due to a lack of
available experimental data for newly emerging material
systems. Moreover, computationally affordable models are
typically limited to defect-free single crystals, omitting
microstructural effects that strongly influence the
material’s behavior. This study addresses this gap by
proposing a novel experimental approach to measure
direction-dependent elastic constants, combining synchrotron
microdiffraction and micropillar compression, testing a
polycrystalline face-centered cubic TiN$_{0.8}$B$_{0.2}$
thin film, where linear elastic failure prevails. We have
established an advanced in-situ testing environment to
continuously record the load–displacement of the indenter
while simultaneously collecting the material’s deformation
response to uniform uniaxial compression. This dynamic
approach allows the evaluation of the orientation-dependent
elastic strain components and the macroscopic uniaxial
compressive stresses, each over time, enabling a
differential analysis to assess the elastic and X-ray
elastic constants. The excellent agreement between
experimental and ab initio data solidifies the here-proposed
robust method for direct elastic constant measurements,
which is crucial for advancements in thin film material
testing.},
cin = {DOOR ; HAS-User / Hereon},
ddc = {690},
cid = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)Hereon-20210428},
pnm = {6G3 - PETRA III (DESY) (POF4-6G3) / FS-Proposal: I-20221274
EC (I-20221274-EC)},
pid = {G:(DE-HGF)POF4-6G3 / G:(DE-H253)I-20221274-EC},
experiment = {EXP:(DE-H253)P-P03-20150101},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001432047500001},
doi = {10.1016/j.matdes.2025.113720},
url = {https://bib-pubdb1.desy.de/record/624365},
}