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@ARTICLE{Losero:622200,
      author       = {Losero, Elena and Goblot, Valentin and Zhu, Yuchun and
                      Babashah, Hossein and Boureau, Victor and Burkart, Florian
                      and Galland, Christophe},
      title        = {{C}reation of {NV} {C}enters in {D}iamond under 155 {M}e{V}
                      {E}lectron {I}rradiation},
      journal      = {Advanced physics research},
      volume       = {3},
      number       = {2},
      issn         = {2751-1200},
      address      = {Weinheim},
      publisher    = {Wiley-VCH GmbH},
      reportid     = {PUBDB-2025-00238, arXiv:2305.15009},
      pages        = {2300071},
      year         = {2024},
      abstract     = {Single-crystal diamond substrates presenting a high
                      concentration of negatively charged nitrogen-vacancy centers
                      (NV−) are on high demand for the development of optically
                      pumped solid-state sensors such as magnetometers,
                      thermometers, or electrometers. While nitrogen impurities
                      can be easily incorporated during crystal growth, the
                      creation of vacancies requires further treatment. Electron
                      irradiation and annealing is often chosen in this context,
                      offering advantages with respect to irradiation by heavier
                      particles that negatively affect the crystal lattice
                      structure and consequently the NV− optical and spin
                      properties. A thorough investigation of electron irradiation
                      possibilities is needed to optimize the process and improve
                      the sensitivity of NV-based sensors. In this work, the
                      effect of electron irradiation is examined in a previously
                      unexplored regime: extremely high energy electrons, at 155
                      MeV. A simulation model is developed to estimate the
                      concentration of created vacancies and an increase of NV−
                      concentration by more than three orders of magnitude
                      following irradiation of a nitrogen-rich HPHT diamond over a
                      very large sample volume is experimentally demonstrated,
                      which translates into an important gain in sensitivity.
                      Moreover, the impact of electron irradiation in this
                      peculiar regime on other figures of merits relevant for NV
                      sensing is discussed, including charge state conversion
                      efficiency and spin relaxation time. Finally, the effect of
                      extremely high energy irradiation is compared with the more
                      conventional low energy irradiation process, employing 200
                      keV electrons from a transmission electron microscope, for
                      different substrates and irradiation fluences, evidencing
                      60-fold higher yield of vacancy creation per electron at 155
                      MeV.},
      keywords     = {diamond (autogen) / electron irradiation (autogen) /
                      NV-centers (autogen) / quantum sensing (autogen)},
      cin          = {MIL},
      ddc          = {530},
      cid          = {I:(DE-H253)MIL-20240919},
      pnm          = {621 - Accelerator Research and Development (POF4-621) /
                      EPFLinnovators - The launch of a new industrial PhD
                      programme at EPFL (754354)},
      pid          = {G:(DE-HGF)POF4-621 / G:(EU-Grant)754354},
      experiment   = {EXP:(DE-MLZ)NOSPEC-20140101},
      typ          = {PUB:(DE-HGF)16},
      eprint       = {2305.15009},
      howpublished = {arXiv:2305.15009},
      archivePrefix = {arXiv},
      SLACcitation = {$\%\%CITATION$ = $arXiv:2305.15009;\%\%$},
      UT           = {WOS:001283293800003},
      doi          = {10.1002/apxr.202300071},
      url          = {https://bib-pubdb1.desy.de/record/622200},
}