Home > Publications database > Characterization of the pedestal calibration for the Belle II Pixel Detector |
Bachelor Thesis | PUBDB-2024-07555 |
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2024
Abstract: The pixel detector of the Belle II experiment is based on the DEPFET technology. Fora reliable readout, it is essential to determine the pedestal (baseline current) of each pixel.This work focuses on characterizing the pedestal measurements and their development overtime. For this purpose, data over a period of two months was analyzed for fluctuations overseconds and the formation of geometric structures.While most pixels exhibit negligible fluctuations over short time periods, some show discrete jumps in the pedestal values. Structures in rows, columns and in edge regions can beobserved. Most notably the ’double row effect’, which highlights a behavioral differencebetween adjacent double rows, stands out in the development over time. This effect resultsin divergent pedestal values that, if left unaddressed, could affect the detector’s efficiency.Therefore, further investigation of the ’double row effect’ is needed, particularly in light ofany damage that may have occurred to the detector.
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