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@INPROCEEDINGS{Maffessanti:617825,
author = {Maffessanti, Stefano and Hansen, Karsten and Kalavakuru, P.
and Reckleben, C. and Aschauer, S. and Castoldi, A. and
Fiorini, C. and Fischer, Peter and Porro, M.},
title = {{N}oise {A}nalysis of the {CMOS}-{DEPFET} {F}ront-{E}nd of
the {DSSC} {I}mager},
publisher = {IEEE},
reportid = {PUBDB-2024-07086},
pages = {1},
year = {2024},
comment = {2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging
Conference (MIC) and Room Temperature Semiconductor Detector
Conference (RTSD) : [Proceedings] - IEEE, 2024. - ISBN
979-8-3503-8815-2 -
doi:10.1109/NSS/MIC/RTSD57108.2024.10655767},
booktitle = {2024 IEEE Nuclear Science Symposium
(NSS), Medical Imaging Conference (MIC)
and Room Temperature Semiconductor
Detector Conference (RTSD) :
[Proceedings] - IEEE, 2024. - ISBN
979-8-3503-8815-2 -
doi:10.1109/NSS/MIC/RTSD57108.2024.10655767},
abstract = {The DEPFET sensor with signal compression (DSSC) is a
1-megapixel imager developed for the European XFEL. It is
designed to detect X-rays with photon energies between 250
eV and 6 keV, and provides a peak frame-rate of 4.5 MHz. The
smallest independent unit of the detector, called module, is
composed by two sensors, forming a matrix of 512 by 128
active DEPFET pixels, bump-bonded to 16 readout ASICs. The
in-pixel electronics comprises a trapezoidal-shaping filter
with programmable gain and timing, an ADC with finely
tunable gain and offset, and an 800-word long memory. The
characterization of the first CMOS-DEPFET based prototype
modules showed equivalent noise charge (ENC) better than
10e−rms at megahertz frame-rate and room temperature. In
this work, we present the results of a measurement campaign
carried out to disentangle the noise contributions of the
acquisition chain. We exploited the front-end capabilities
and measured the ENC using the knife-edge method, varying
the gain of single stages at a time. The measured ENC vs
gain were fitted and the gain-dependent and -independent
components extracted, and the contributions at key points of
the acquisition chain presented.},
month = {Oct},
date = {2024-10-26},
organization = {2024 IEEE Nuclear Science Symposium
(NSS), Medical Imaging Conference (MIC)
and Room Temperature Semiconductor
Detector Conference (RTSD), Tampa (FL),
26 Oct 2024 - 2 Nov 2024},
cin = {FEC},
cid = {I:(DE-H253)FEC-20120731},
pnm = {622 - Detector Technologies and Systems (POF4-622)},
pid = {G:(DE-HGF)POF4-622},
experiment = {EXP:(DE-MLZ)NOSPEC-20140101},
typ = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1109/NSS/MIC/RTSD57108.2024.10655767},
url = {https://bib-pubdb1.desy.de/record/617825},
}