TY  - CONF
AU  - Maffessanti, Stefano
AU  - Hansen, Karsten
AU  - Kalavakuru, P.
AU  - Reckleben, C.
AU  - Aschauer, S.
AU  - Castoldi, A.
AU  - Fiorini, C.
AU  - Fischer, Peter
AU  - Porro, M.
TI  - Noise Analysis of the CMOS-DEPFET Front-End of the DSSC Imager
PB  - IEEE
M1  - PUBDB-2024-07086
SP  - 1
PY  - 2024
AB  - The DEPFET sensor with signal compression (DSSC) is a 1-megapixel imager developed for the European XFEL. It is designed to detect X-rays with photon energies between 250 eV and 6 keV, and provides a peak frame-rate of 4.5 MHz. The smallest independent unit of the detector, called module, is composed by two sensors, forming a matrix of 512 by 128 active DEPFET pixels, bump-bonded to 16 readout ASICs. The in-pixel electronics comprises a trapezoidal-shaping filter with programmable gain and timing, an ADC with finely tunable gain and offset, and an 800-word long memory. The characterization of the first CMOS-DEPFET based prototype modules showed equivalent noise charge (ENC) better than 10e−rms at megahertz frame-rate and room temperature. In this work, we present the results of a measurement campaign carried out to disentangle the noise contributions of the acquisition chain. We exploited the front-end capabilities and measured the ENC using the knife-edge method, varying the gain of single stages at a time. The measured ENC vs gain were fitted and the gain-dependent and -independent components extracted, and the contributions at key points of the acquisition chain presented.
T2  - 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
CY  - 26 Oct 2024 - 2 Nov 2024, Tampa (FL)
Y2  - 26 Oct 2024 - 2 Nov 2024
M2  - Tampa, FL
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
DO  - DOI:10.1109/NSS/MIC/RTSD57108.2024.10655767
UR  - https://bib-pubdb1.desy.de/record/617825
ER  -