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| 001 | 616423 | ||
| 005 | 20250715151535.0 | ||
| 024 | 7 | _ | |a 10.1088/1748-0221/20/02/C02020 |2 doi |
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| 082 | _ | _ | |a 610 |
| 088 | _ | _ | |a ATL-COM-ITK-2024-125 |2 Atlas |
| 100 | 1 | _ | |a Bauckhage, Lukas |0 P:(DE-H253)PIP1107938 |b 0 |e Corresponding author |
| 111 | 2 | _ | |a Topical Workshop on Electronics For Particle Physics |g TWEPP 2024 |c Glasgow |d 2024-09-30 - 2024-10-04 |w UK |
| 245 | _ | _ | |a Experiences and Lessons Learned from the End-of-Substructure card production of the ATLAS ITk Strip Upgrade |
| 260 | _ | _ | |a London |c 2025 |b Inst. of Physics |
| 300 | _ | _ | |a 2025 JINST 20 C02020 |
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| 500 | _ | _ | |a The status is the draft sent to the ATLAS speaker committee and later to JINST. Depending on the comments of reviewers it will change. Only then the final fields get available. |
| 520 | _ | _ | |a The silicon tracker of the ATLAS experiment will be upgraded for the upcoming High-Luminosity Upgrade of the LHC. The main building blocks of the new strip tracker are modules that consist of silicon sensors and hybrid PCBs hosting the read-out ASICs. The modules are mounted on rigid carbon-fiber substructures, known as staves in the central barrel region and petals in the end-cap regions, that provide common services to all the modules. At the end of each stave or petal side, a so-called End-of-Substructure (EoS) card facilitates the transfer of data, power, and control signals between the modules and the off-detector systems. The EoS connects up to 28 data lines to one or two lpGBT chips that provide data serialization and uses a 10Gbit s−1 versatile optical link to transmit signals to the off-detector systems. To meet the tight integration requirements in the detector, several different EoS card designs are needed. The power to the EoS is provided by a dedicated dual-stage DC-DC package providing 2.5V and 1.2V to the EoS cards. As the EoS production of almost 2000 EoS cards and accompanying DC-DC converters is getting close to completion, the production experience including detailed QC statistics and design validation (QA) results is reported on. |
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| 700 | 1 | _ | |a Boebel, Artur |0 P:(DE-H253)PIP1088786 |b 1 |
| 700 | 1 | _ | |a Ceslik, Harald |0 P:(DE-H253)PIP1080240 |b 2 |
| 700 | 1 | _ | |a Arranca Menezes Trigueiros da Silva, André Filipe |0 P:(DE-H253)PIP1107756 |b 3 |
| 700 | 1 | _ | |a Dam, Mogens |0 P:(DE-HGF)0 |b 4 |
| 700 | 1 | _ | |a Diez Cornell, Sergio |0 P:(DE-H253)PIP1022240 |b 5 |
| 700 | 1 | _ | |a Garvey, Cameron Michael |0 P:(DE-H253)PIP1101041 |b 6 |
| 700 | 1 | _ | |a Godfredsen, R. S. |0 P:(DE-HGF)0 |b 7 |
| 700 | 1 | _ | |a Göttlicher, Peter |0 P:(DE-H253)PIP1002570 |b 8 |
| 700 | 1 | _ | |a Gregor, Ingrid-Maria |0 P:(DE-H253)PIP1004563 |b 9 |
| 700 | 1 | _ | |a Keaveney, James Michael |0 P:(DE-H253)PIP1028437 |b 10 |
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| 700 | 1 | _ | |a Ruiz Daza, Sara |0 P:(DE-H253)PIP1099054 |b 12 |
| 700 | 1 | _ | |a Schmitt, Stefan |0 P:(DE-H253)PIP1001586 |b 13 |
| 700 | 1 | _ | |a Stanitzki, Marcel |0 P:(DE-H253)PIP1014417 |b 14 |
| 700 | 1 | _ | |a Stroem, Lars Rickard |0 P:(DE-H253)PIP1089313 |b 15 |
| 773 | _ | _ | |a 10.1088/1748-0221/20/02/C02020 |g Vol. 20, no. 02, p. C02020 - |0 PERI:(DE-600)2235672-1 |n 02 |p C02020 - |t Journal of Instrumentation |v 20 |y 2025 |x 1748-0221 |
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