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000616025 1001_ $$0P:(DE-H253)PIP1097254$$aMohammadi Bidhendi, Mahdi$$b0$$eCorresponding author$$udesy
000616025 245__ $$aDetermination of the XUV frequency chirp at the free-electron laser FLASH by THz streaking and electron beam diagnostic
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000616025 520__ $$aFree-electron lasers (FELs) operating in the extreme ultraviolet (XUV) and X-ray regions deliver ultrashort pulses with unprecedented intensity, enabling groundbreaking research across various scientific disciplines. A potential chirp (frequency change within the pulse) of these pulses influences their spectral properties, directly impacting the experimental outcomes and FEL performance. The accurate characterization of {the} chirp is, therefore, important for optimizing FEL operation and interpreting experimental results.This study presents a comprehensive comparison of two techniques determining the chirp of the XUV pulses at FLASH by directly measuring the XUV pulses with THz streaking and by detecting the chirp of the electron bunches by a Transverse Deflection Structure (PolariX TDS) to infer the XUV chirp. We conducted simultaneous measurements using both techniques at FLASH2 while tuning the FEL to produce various energy chirps on the electron bunch.
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000616025 693__ $$0EXP:(DE-H253)F-FL21-20211112$$1EXP:(DE-H253)FLASHII-20150901$$6EXP:(DE-H253)F-FL21-20211112$$aFLASH2$$fFLASH2 Beamline FL21$$x0
000616025 7001_ $$0P:(DE-H253)PIP1096830$$aGoetzke, Gesa Inken Caroline$$b1
000616025 7001_ $$0P:(DE-H253)PIP1031019$$aBermudez Macias, Ivette Jazmin$$b2
000616025 7001_ $$0P:(DE-H253)PIP1019912$$aIvanov, Rosen$$b3
000616025 7001_ $$0P:(DE-H253)PIP1001599$$aSchneidmiller, Evgeny Alexanrdovich$$b4
000616025 7001_ $$0P:(DE-H253)PIP1093657$$aMirian, Najmeh$$b5
000616025 7001_ $$0P:(DE-H253)PIP1002687$$aDuesterer, Stefan$$b6
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