| Home > Publications database > Diamond sensors for hard X-ray energy and position resolving measurements at the European XFEL > print |
| 001 | 615639 | ||
| 005 | 20251104143915.0 | ||
| 024 | 7 | _ | |a 10.1107/S1600577524006015 |2 doi |
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| 100 | 1 | _ | |a Çonka Yıldız, Tuba |0 P:(DE-HGF)0 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Diamond sensors for hard X-ray energy and position resolving measurements at the European XFEL |
| 260 | _ | _ | |a [Erscheinungsort nicht ermittelbar] |c 2024 |b Wiley-Blackwell |
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| 520 | _ | _ | |a The diagnostics of X-ray beam properties has a critical importance at the European X-ray Free-Electron Laser facility. Besides existing diagnostic components, utilization of a diamond sensor was proposed to achieve radiation-hard, non-invasive beam position and pulse energy measurements for hard X-rays. In particular, with very hard X-rays, diamond-based sensors become a useful complement to gas-based devices which lose sensitivity due to significantly reduced gas cross-sections. The measurements presented in this work were performed with diamond sensors consisting of an electronic-grade single-crystal chemical-vapor-deposition diamond with position-sensitive resistive electrodes in a duo-lateral configuration. The results show that the diamond sensor delivers pulse-resolved X-ray beam position data at 2.25 MHz with an uncertainty of less than 1% of the beam size. To our knowledge this is the first demonstration of pulse-resolved position measurements at the MHz rate using a transmissive diamond sensor at a free-electron laser facility. It can therefore be a valuable tool for X-ray free-electron lasers, especially for high-repetition-rate machines, enabling applications such as beam-based alignment and intra-pulse-train position feedback. |
| 536 | _ | _ | |a 6G13 - Accelerator of European XFEL (POF4-6G13) |0 G:(DE-HGF)POF4-6G13 |c POF4-6G13 |f POF IV |x 0 |
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| 693 | _ | _ | |a XFEL |e Experiments at XFEL |1 EXP:(DE-H253)XFEL-20150101 |0 EXP:(DE-H253)XFEL-Exp-20150101 |5 EXP:(DE-H253)XFEL-Exp-20150101 |x 0 |
| 700 | 1 | _ | |a Freund, Wolfgang |b 1 |
| 700 | 1 | _ | |a Liu, Jia |0 P:(DE-H253)PIP1019426 |b 2 |
| 700 | 1 | _ | |a Schreck, Matthias |b 3 |
| 700 | 1 | _ | |a Khakhulin, Dmitry |b 4 |
| 700 | 1 | _ | |a Yousef, Hazem |b 5 |
| 700 | 1 | _ | |a Milne, Christopher |b 6 |
| 700 | 1 | _ | |a Grünert, Jan |b 7 |
| 773 | 1 | 8 | |a 10.1107/s1600577524006015 |b International Union of Crystallography (IUCr) |d 2024-07-30 |n 5 |p 1029-1036 |3 journal-article |2 Crossref |t Journal of Synchrotron Radiation |v 31 |y 2024 |x 1600-5775 |
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| 999 | C | 5 | |2 Crossref |u Bloomer, C., Bobb, L., Newton, M. E., Freund, W., Grünert, J. & Liu, J. (2022). Proceedings of the 11th International Beam Instrumentation Conference (IBIC 2022), 11-15 September 2022, Krakow, Poland, pp. 416-420. WEP15. |
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