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001     614810
005     20250804171702.0
024 7 _ |a 10.1107/S1600576724000992
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041 _ _ |a English
082 _ _ |a 540
100 1 _ |a Berberich, Tim B.
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245 _ _ |a A workflow for single-particle structure determination via iterative phasing of rotational invariants in fluctuation X-ray scattering
260 _ _ |a [Erscheinungsort nicht ermittelbar]
|c 2024
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520 _ _ |a Fluctuation X-ray scattering (FXS) offers a complementary approach for nano-and bioparticle imaging with an X-ray free-electron laser (XFEL), by extractingstructural information from correlations in scattered XFEL pulses. Here aworkflow is presented for single-particle structure determination using FXS. Theworkflow includes procedures for extracting the rotational invariants from FXSpatterns, performing structure reconstructions via iterative phasing of theinvariants, and aligning and averaging multiple reconstructions. The recon-struction pipeline is implemented in the open-source software xFrame and itsfunctionality is demonstrated on several simulated structures.
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700 1 _ |a Molodtsov, Serguei L.
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700 1 _ |a Kurta, Ruslan
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773 1 8 |a 10.1107/s1600576724000992
|b International Union of Crystallography (IUCr)
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|t Journal of Applied Crystallography
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773 _ _ |a 10.1107/S1600576724000992
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