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@ARTICLE{Khaliq:614020,
author = {Khaliq, Ahmar and Wittwer, Felix and Pyrlik, Niklas and
Fevola, Giovanni and Patjens, Svenja and Barp, Jackson and
Falkenberg, Gero and Hampel, Sven and Stückelberger,
Michael and Garrevoet, Jan and Brueckner, Dennis Bjoern and
Modregger, Peter},
title = {{M}easurements of dislocations in 4{H}-{S}i{C} with rocking
curve imaging},
reportid = {PUBDB-2024-05721, arXiv:2409.00200},
year = {2024},
abstract = {4H Silicon Carbide (4H-SiC) combines many attractive
properties such as a high carrier mobility, a wide bandgap,
and a high thermal conductivity, making it an ideal
candidate for high-power electronic devices. However, a
primary challenge in utilizing 4H-SiC is the presence of
defects in epitaxial layers, which can significantly degrade
device performance. In this study, we have used X-ray
transmission topography with a rocking curve imaging
technique to characterize the types and distribution of
defects in 4H-SiC. The derived maps from the fitted Gaussian
parameters were used to investigate dislocations in 4H-SiC.
Understanding the distribution of the dislocations provides
valuable insights into the overall crystal quality, which
can guide improvements for the fabrication processes.},
cin = {FS-PETRA},
cid = {I:(DE-H253)FS-PETRA-20140814},
pnm = {632 - Materials – Quantum, Complex and Functional
Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3) /
FS-Proposal: I-20231255 (I-20231255)},
pid = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3 /
G:(DE-H253)I-20231255},
experiment = {EXP:(DE-H253)P-P06-20150101 /
EXP:(DE-H253)Nanolab-03-20150101},
typ = {PUB:(DE-HGF)25},
eprint = {2409.00200},
howpublished = {arXiv:2409.00200},
archivePrefix = {arXiv},
SLACcitation = {$\%\%CITATION$ = $arXiv:2409.00200;\%\%$},
url = {https://bib-pubdb1.desy.de/record/614020},
}