TY  - JOUR
AU  - Kneschaurek, Ekaterina
AU  - Hinderhofer, Alexander
AU  - Hofferberth, Bernd
AU  - Scheffczyk, Niels
AU  - Pithan, Linus
AU  - Zimmermann, Paul
AU  - Merten, Lena
AU  - Bertram, Florian
AU  - Schreiber, Frank
TI  - Compact sample environment for in situ X-ray scattering during spin-coating
JO  - Review of scientific instruments
VL  - 94
IS  - 6
SN  - 0034-6748
CY  - [Erscheinungsort nicht ermittelbar]
PB  - American Institute of Physics
M1  - PUBDB-2023-07160
SP  - 063901
PY  - 2023
AB  - We demonstrate a compact sample environment for the in situ study of crystallization kinetics of thin films on synchrotron beamlines, featuring atmospheric control, automated deposition, spin-coating, and annealing stages. The setup is suitable for studying thin film growth in real time using grazing-incidence X-ray diffraction techniques. Humidity and oxygen levels are being detected by sensors. The spinning stage exhibits low vertical oscillation amplitude (  3μ⁠m at speeds up to 10 000 rpm) and can optionally be employed for antisolvent application or gas quenching to investigate the impact of these techniques, which are often used to assist thin film growth. Differential reflectance spectroscopy is implemented in the spin-coater environment for inspecting thin film thickness and optical properties. The infrared radiation-based annealing system consists of a halogen lamp and a holder with an adjustable lamp-to-sample distance, while the sample surface temperature is monitored by a pyrometer. All features of the sample environment can be controlled remotely by the control software at synchrotron beamlines. In order to test and demonstrate the performance, the crystallization pathway of the antisolvent-assisted MAPbI<sub>3</sub> (MA = methylammonium) perovskite thin film during the spinning and annealing stages is monitored and discussed. 
LB  - PUB:(DE-HGF)16
C6  - 37862478
UR  - <Go to ISI:>//WOS:001000476800002
DO  - DOI:10.1063/5.0149613
UR  - https://bib-pubdb1.desy.de/record/599094
ER  -