Home > Publications database > A sensitive high repetition rate arrival time monitor for X-ray free electron lasers > print

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024 7 _ |a 10.1038/s41467-023-38143-y
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100 1 _ |a Diez, Michael
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245 _ _ |a A sensitive high repetition rate arrival time monitor for X-ray free electron lasers
260 _ _ |a [London]
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520 _ _ |a X-ray free-electron laser sources enable time-resolved X-ray studies with unmatched temporal resolution. To fully exploit ultrashort X-ray pulses, timing tools are essential. However, new high repetition rate X-ray facilities present challenges for currently used timing tool schemes. Here we address this issue by demonstrating a sensitive timing tool scheme to enhance experimental time resolution in pump-probe experiments at very high pulse repetition rates. Our method employs a self-referenced detection scheme using a time-sheared chirped optical pulse traversing an X-ray stimulated diamond plate. By formulating an effective medium theory, we confirm subtle refractive index changes, induced by sub-milli-Joule intense X-ray pulses, that are measured in our experiment. The system utilizes a Common-Path-Interferometer to detect X-ray-induced phase shifts of the optical probe pulse transmitted through the diamond sample. Owing to the thermal stability of diamond, our approach is well-suited for MHz pulse repetition rates in superconducting linear accelerator-based free-electron lasers.
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700 1 _ |a Kirchberg, Henning
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700 1 _ |a Bressler, Christian
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773 _ _ |a 10.1038/s41467-023-38143-y
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