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| 001 | 598042 | ||
| 005 | 20250715170931.0 | ||
| 024 | 7 | _ | |a 10.1088/1748-0221/19/01/P01020 |2 doi |
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| 024 | 7 | _ | |a arXiv:2311.13220 |2 arXiv |
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| 082 | _ | _ | |a 610 |
| 088 | _ | _ | |a arXiv:2311.13220 |2 arXiv |
| 100 | 1 | _ | |a Diehl, Inge |0 P:(DE-H253)PIP1000066 |b 0 |e Corresponding author |u desy |
| 245 | _ | _ | |a Monolithic MHz-frame rate digital SiPM-IC with sub-100 ps precision and 70$~\mu$m pixel pitch |
| 260 | _ | _ | |a London |c 2024 |b Inst. of Physics |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 500 | _ | _ | |a 16 pages, 13 figures, 1 table |
| 520 | _ | _ | |a This paper presents the design and characterization of a monolithic integrated circuit (IC) including digital silicon photomultipliers (dSiPMs) arranged in a 32$~\times~$32 pixel matrix at 70$~\mu$m pitch. The IC provides per-quadrant time stamping and hit-map readout, and is fabricated in a standard 150-nm CMOS technology. Each dSiPM pixel consists of four single-photon avalanche diodes (SPADs) sharing a quenching and subsequent processing circuitry and has a fill factor of 30$~\%$. A sub-100$~$ps precision, 12-bit time-to-digital converter (TDC) provides timestamps per quadrant with an acquisition rate of 3$~$MHz. Together with the hit map, the total sustained data throughput of the IC amounts to 4$~$Gbps. Measurements obtained in a dark, temperature-stable environment as well as by using a pulsed laser environment show the full dSiPM-IC functionality. The dark-count rate (DCR) as function of the overvoltage and temperature, the TDC resolution, differential and integral nonlinearity (DNL/INL) as well as the propagation-delay variations across the matrix are presented. With aid of additional peripheral test structures, the main building blocks are characterized and key parameters are presented. |
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| 542 | _ | _ | |i 2024-01-18 |2 Crossref |u http://creativecommons.org/licenses/by/4.0/ |
| 542 | _ | _ | |i 2024-01-18 |2 Crossref |u https://iopscience.iop.org/info/page/text-and-data-mining |
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| 700 | 1 | _ | |a Hansen, K. |b 1 |
| 700 | 1 | _ | |a Vanat, T. |0 P:(DE-H253)PIP1087423 |b 2 |u desy |
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| 700 | 1 | _ | |a Rastorguev, D. |0 P:(DE-H253)PIP1099910 |b 5 |u desy |
| 700 | 1 | _ | |a Spannagel, S. |0 P:(DE-H253)PIP1018940 |b 6 |u desy |
| 773 | 1 | 8 | |a 10.1088/1748-0221/19/01/p01020 |b IOP Publishing |d 2024-01-01 |n 01 |p P01020 |3 journal-article |2 Crossref |t Journal of Instrumentation |v 19 |y 2024 |x 1748-0221 |
| 773 | _ | _ | |a 10.1088/1748-0221/19/01/P01020 |g Vol. 19, no. 01, p. P01020 - |0 PERI:(DE-600)2235672-1 |n 01 |p P01020 |t Journal of Instrumentation |v 19 |y 2024 |x 1748-0221 |
| 856 | 4 | _ | |u https://iopscience.iop.org/article/10.1088/1748-0221/19/01/P01020 |
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