001     596099
005     20231002123508.0
024 7 _ |a arXiv:2301.06804
|2 arXiv
037 _ _ |a PUBDB-2023-06047
088 _ _ |a arXiv:2301.06804
|2 arXiv
100 1 _ |a Lanzieri, Leandro
|0 P:(DE-HGF)0
|b 0
245 _ _ |a A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems
336 7 _ |a Preprint
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336 7 _ |a WORKING_PAPER
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336 7 _ |a Electronic Article
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336 7 _ |a preprint
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336 7 _ |a ARTICLE
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336 7 _ |a Output Types/Working Paper
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520 _ _ |a Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.
536 _ _ |a HIDSS-0002 - DASHH: Data Science in Hamburg - Helmholtz Graduate School for the Structure of Matter (2019_IVF-HIDSS-0002)
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588 _ _ |a Dataset connected to DataCite
700 1 _ |a Martino, Gianluca
|0 P:(DE-H253)PIP1089152
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700 1 _ |a Fey, Goerschwin
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700 1 _ |a Schlarb, Holger
|0 P:(DE-H253)PIP1000212
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700 1 _ |a Schmidt, Thomas C.
|b 4
700 1 _ |a Wählisch, Matthias
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856 4 _ |u https://arxiv.org/pdf/2301.06804.pdf
910 1 _ |a External Institute
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910 1 _ |a Deutsches Elektronen-Synchrotron
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980 1 _ |a EXTERN4COORD
980 _ _ |a preprint
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980 _ _ |a I:(DE-H253)MSK-20120731
980 _ _ |a I:(DE-H253)PhotonScience-20170411
980 _ _ |a I:(DE-H253)FS-PS-20131107


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