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@ARTICLE{Lanzieri:596099,
author = {Lanzieri, Leandro and Martino, Gianluca and Fey, Goerschwin
and Schlarb, Holger and Schmidt, Thomas C. and Wählisch,
Matthias},
title = {{A} {R}eview of {T}echniques for {A}geing {D}etection and
{M}onitoring on {E}mbedded {S}ystems},
reportid = {PUBDB-2023-06047, arXiv:2301.06804},
abstract = {Embedded digital devices, such as Field-Programmable Gate
Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly
used in dependable or safety-critical systems. These
commodity devices are subject to notable hardware ageing,
which makes failures likely when used for an extended time.
It is of vital importance to understand ageing processes and
to detect hardware degradations early. In this survey, we
describe the fundamental ageing mechanisms and review the
main techniques for detecting ageing in FPGAs,
microcontrollers, SoCs, and power supplies. The main goal of
this work is to facilitate future research efforts in this
field by presenting all main approaches in an organized
way.},
pnm = {HIDSS-0002 - DASHH: Data Science in Hamburg - Helmholtz
Graduate School for the Structure of Matter
$(2019_IVF-HIDSS-0002)$},
pid = {$G:(DE-HGF)2019_IVF-HIDSS-0002$},
typ = {PUB:(DE-HGF)25},
eprint = {2301.06804},
howpublished = {arXiv:2301.06804},
archivePrefix = {arXiv},
SLACcitation = {$\%\%CITATION$ = $arXiv:2301.06804;\%\%$},
url = {https://bib-pubdb1.desy.de/record/596099},
}