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000596099 005__ 20231002123508.0
000596099 0247_ $$2arXiv$$aarXiv:2301.06804
000596099 037__ $$aPUBDB-2023-06047
000596099 088__ $$2arXiv$$aarXiv:2301.06804
000596099 1001_ $$0P:(DE-HGF)0$$aLanzieri, Leandro$$b0
000596099 245__ $$aA Review of Techniques for Ageing Detection and Monitoring on Embedded Systems
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000596099 520__ $$aEmbedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.
000596099 536__ $$0G:(DE-HGF)2019_IVF-HIDSS-0002$$aHIDSS-0002 - DASHH: Data Science in Hamburg - Helmholtz Graduate School for the Structure of Matter (2019_IVF-HIDSS-0002)$$c2019_IVF-HIDSS-0002$$x0
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000596099 7001_ $$0P:(DE-H253)PIP1089152$$aMartino, Gianluca$$b1
000596099 7001_ $$0P:(DE-HGF)0$$aFey, Goerschwin$$b2
000596099 7001_ $$0P:(DE-H253)PIP1000212$$aSchlarb, Holger$$b3$$udesy
000596099 7001_ $$aSchmidt, Thomas C.$$b4
000596099 7001_ $$0P:(DE-HGF)0$$aWählisch, Matthias$$b5
000596099 8564_ $$uhttps://arxiv.org/pdf/2301.06804.pdf
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000596099 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1000212$$aDeutsches Elektronen-Synchrotron$$b3$$kDESY
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000596099 980__ $$aI:(DE-H253)PhotonScience-20170411
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