Home > Publications database > Operando X-ray scattering elucidates the photocorrosion mechanism of CuBi$_2$O$_4$ films > print |
001 | 594778 | ||
005 | 20250724132220.0 | ||
024 | 7 | _ | |a 10.26434/chemrxiv-2023-j1q9w |2 doi |
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100 | 1 | _ | |a Derelli, Davide |0 P:(DE-H253)PIP1091883 |b 0 |
245 | _ | _ | |a Operando X-ray scattering elucidates the photocorrosion mechanism of CuBi$_2$O$_4$ films |
260 | _ | _ | |c 2023 |
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520 | _ | _ | |a CuBi2O4 has recently emerged as a promising photocathode for photo-electrochemical (PEC) water splitting. However, its fast degradation under operation currently poses a limit to its application. Here, we report a novel method to study operando the semiconductor-electrolyte interface during PEC operation by surface-sensitive high-energy X-ray scattering. We find that a fast decrease in the generated photocurrents correlates directly with the formation of a metallic Bi phase. We further show that the slower formation of metallic Cu, as well as the dissolution of the electrode in contact with the electrolyte, further affect the CuBi$_2$O$_4$ activity and morphology. Our study provides a comprehensive picture of the degradation mechanisms affecting CuBi$_2$O$_4$ electrodes under operation and poses the methodological basis to investigate the photocorrosion processes affecting a wide range of PEC materials. |
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700 | 1 | _ | |a Koziej, Dorota |0 P:(DE-H253)PIP1031321 |b 13 |e Corresponding author |
773 | _ | _ | |a 10.26434/chemrxiv-2023-j1q9w |
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